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Identification of preferentially exposed crystal facets by X-ray diffraction

机译：通过X射线衍射识别优先暴露的晶面

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摘要

Crystals with exposed facets are popular materials in many catalytic applications due to their high reactivity. Facet identification is often conducted by transmission electron microscopy (TEM). In this work, we analyze the effects of doping, vacancy creation, anisotropic broadening, and preferred orientation on the intensity of X-ray diffraction (XRD) peaks by using tetragonal bismuth oxyhalides (BiOX, X = Cl, Br, and I) as examples. The differences in these effects were successfully used to identify the preferentially exposed (001) facets of BiOX nanoplates synthesized by a polymer-assisted precipitation method. In comparison to TEM, the XRD analysis is not only cheaper and easier to perform, but also it gives results representative for the sample. This work aims to provide further justification for the use of XRD as a powerful and handy characterization technique in the field of crystal facet engineering.
机译：具有暴露刻面的晶体是由于其高反应性，许多催化应用中的流行材料。 面部识别通常通过透射电子显微镜（TEM）进行。 在这项工作中，我们通过使用四边形嗜酸铋（Biox，X = Cl，Br，I）来分析掺杂，空位产生，各向异性扩大和优选取向对X射线衍射（XRD）峰的强度的影响。 例子。 这些效果的差异成功地用于鉴定通过聚合物辅助沉淀法合成的Biox纳米层的优先暴露的（001）刻面。 与TEM相比，XRD分析不仅便宜，更容易执行，而且它还为样本提供了结果代表性。 这项工作旨在提供XRD在水晶面工程领域中使用XRD作为强大而方便的表征技术的理由。

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