Spatial pattern-shifting method for complete two-wavelength fringe projection profilometry 9vol 45, pg 3115, 2020)

著录项

• 来源
  《Optics Letters》 |2020年第18期|共1页
• 作者

  Lin Chu; Zheng Dongliang; Kemao Qian; Han Jing; Bai Lianfa;

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• 作者单位

  Nanjing Univ Sci &

  Technol Sch Elect &

  Opt Engn Nanjing 210094 Peoples R China;

  Nanjing Univ Sci &

  Technol Sch Elect &

  Opt Engn Nanjing 210094 Peoples R China;

  Nanyang Technol Univ Sch Comp Sci &

  Engn Singapore 639798 Singapore;

  Nanjing Univ Sci &

  Technol Sch Elect &

  Opt Engn Nanjing 210094 Peoples R China;

  Nanjing Univ Sci &

  Technol Sch Elect &

  Opt Engn Nanjing 210094 Peoples R China;

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• 原文格式 PDF
• 正文语种 eng
• 中图分类 计量学;光学;
• 关键词