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Sub-second hyper-spectral low-frequency vibrational imaging via impulsive Raman excitation

机译:通过脉冲拉曼励磁次第二超频低频振动成像

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摘要

Real-time vibrational microscopy has been recently demonstrated by various techniques, most of them utilizing the well-known schemes of coherent anti-stokes Raman scattering and stimulated Raman scattering. These techniques readily provide valuable chemical information mostly in the higher vibrational frequency regime (>400 cm(-1)). Addressing the low vibrational frequency regime (<200 cm(-1)) is challenging due to the usage of spectral filters that are required to isolate the signal from the Rayleigh scattered excitation field. In this Letter, we report on rapid, high-resolution, low-frequency (<130 cm(-1)) vibrational microscopy using impulsive coherent Raman excitation. By combining impulsive excitation with a fast acousto-optic delay line, we detect the Raman-induced optical Kerr lensing and spectral shift effects with a 25 mu s pixel dwell time to produce shot-noise limited, low-frequency hyper-spectral images of various samples. (C) 2019 Optical Society of America
机译:最近通过各种技术证明了实时振动显微镜,其中大多数是利用相干抗斯托克斯拉曼散射和刺激的拉曼散射的公知方案。 这些技术在较高振动频率调节(> 400cm(-1))中,大多数提供了有价值的化学信息。 寻址低振动频率调节(<200cm(-1))由于使用从瑞利散射激励场中所需的光谱滤波器的使用而具有挑战性。 在这封信中,我们使用脉冲相干拉曼励磁报告快速,高分辨率低频(<130cm(-1))振动显微镜。 通过用快速声光延迟线组合冲动激励,我们检测拉曼诱导的光学克尔镜头和使用25 mu S的像素停留时间来产生射击噪声限制,低频超频图像的各种 样品。 (c)2019年光学学会

著录项

  • 来源
    《Optics Letters》 |2019年第21期|共4页
  • 作者单位

    Weizmann Inst Sci Dept Phys Complex Syst IL-76100 Rehovot Israel;

    Aix Marseille Univ Inst Fresnel Cent Marseille CNRS Marseille France;

    Aix Marseille Univ Inst Fresnel Cent Marseille CNRS Marseille France;

    Weizmann Inst Sci Dept Mat &

    Interfaces IL-76100 Rehovot Israel;

    Weizmann Inst Sci Dept Mat &

    Interfaces IL-76100 Rehovot Israel;

    Weizmann Inst Sci Dept Mat &

    Interfaces IL-76100 Rehovot Israel;

    Fastlite F-06600 Antibes France;

    Aix Marseille Univ Inst Fresnel Cent Marseille CNRS Marseille France;

    Weizmann Inst Sci Dept Phys Complex Syst IL-76100 Rehovot Israel;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 计量学;光学;
  • 关键词

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