Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction

Krewer Keno L.; Mics Zoltan; Arabski Jacek; Schmerber Guy; Beaurepaire Eric; Bonn Mischa; Turchinovich Dmitry

首页> 外文期刊>Optics Letters >Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction

【24h】

Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction

机译：通过精确的基板厚度校正精确支撑薄膜的太赫兹光谱学

获取原文

获取原文并翻译 | 示例

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相似文献
相关主题

摘要

We present a new approach for accurate terahertz time-domain spectroscopy of thin films deposited on dielectric substrates. Our approach relies on the simultaneous measurement of film and substrate, allowing for 15 nm-precise determination of the thickness variation between the sample and reference. Our approach allows for unprecedentedly accurate determination of the terahertz conductivity of the thin film. We demonstrate our approach on a 10 nm thin iron film deposited on a 500 mu m MgO substrate. We determine the Drude momentum relaxation time in iron to within 0.15 fs uncertainty. (C) 2018 Optical Society of America

机译：我们提出了一种新方法，用于沉积在介电基板上的薄膜的精确太赫兹时域光谱。我们的方法依赖于同时测量薄膜和基材，允许在样品和参考之间的厚度变化的厚度变化来确定15nm精确的测定。我们的方法允许前所未有地确定薄膜的太赫兹电导率的确定。我们在沉积在500μmmgo衬底上的10 nm薄的铁膜上证明了我们的方法。我们确定铁的博德动量放松时间在0.15 fs不确定性范围内。（c）2018年光学学会

著录项

来源
《Optics Letters》 |2018年第3期|共4页
作者
Krewer Keno L.; Mics Zoltan; Arabski Jacek; Schmerber Guy; Beaurepaire Eric; Bonn Mischa; Turchinovich Dmitry;
展开▼
作者单位

Max Planck Inst Polymer Res D-55128 Mainz Germany;

Max Planck Inst Polymer Res D-55128 Mainz Germany;

Inst Phys &

Chim Mat Strasbourg F-67200 Strasbourg France;

Inst Phys &

Chim Mat Strasbourg F-67200 Strasbourg France;

Inst Phys &

Chim Mat Strasbourg F-67200 Strasbourg France;

Max Planck Inst Polymer Res D-55128 Mainz Germany;

Max Planck Inst Polymer Res D-55128 Mainz Germany;

展开▼
收录信息
原文格式 PDF
正文语种 eng
中图分类计量学;光学;
关键词

相似文献

外文文献
中文文献
专利

1. Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction [J] . Krewer Keno L., Mics Zoltan, Arabski Jacek, Optics Letters . 2018,第3期

机译：通过精确的基板厚度校正精确支撑薄膜的太赫兹光谱学
2. Development and characterization of cyclic olefin copolymer thin films and their dielectric characteristics as CPW substrate by means of Terahertz Time Domain Spectroscopy [J] . Diaz-Albarran L. M., Lugo-Hernandez E., Ramirez-Garcia E., Microelectronic Engineering . 2018,第MAY期

机译：太赫兹时域光谱技术开发，表征环烯烃共聚物薄膜及其作为CPW衬底的介电特性
3. Application of Terahertz Time-Domain Spectroscopy in Characterizing Thin Metal Film–Substrate Structures [J] . Ma Weihao, Li Chuanwei, Wang Zhiyong, Terahertz Science and Technology, IEEE Transactions on . 2020,第6期

机译：太赫兹时域光谱在薄金属薄膜基板结构表征中的应用
4. Precise Fourier transform spectroscopy based measurement of dielectric properties of thin films at terahertz frequency range [C] . Chao Liu, Sharma Anjali, Afsar Mohammed N. Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International . 2012

机译：基于精确傅里叶变换光谱的太赫兹频率范围内薄膜介电性能的测量
5. Terahertz emission spectroscopy of gallium arsenide and thin magnetic films. [D] . Schleicher, James Michael. 2008

机译：砷化镓和磁性薄膜的太赫兹发射光谱。
6. Correction: G. Papari et al. Terahertz Spectroscopy of Amorphous WSe2 and MoSe2 Thin Films. Materials 2018 11 1613 [O] . Gian Paolo Papari, Can Koral, Toby Hallam, 2020

机译：校正：G. Papari等。非晶WSe2和MoSe2薄膜的太赫兹光谱。材料2018111613
7. Broadband Terahertz Light-Matter Interaction Enhancement for Precise Spectroscopy of Thin Films and Micro-Samples [O] . Romain Peretti, Flavie Braud, Emilien Peytavit, 2018

机译：薄膜和微样品精确光谱的宽带太赫兹灯具相互作用增强

Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction

摘要

著录项

相似文献

相关主题

期刊订阅