Single event effect testing and radiation-hardened designing of several commercial optical transceivers

Zhan Yueying; Cao Suzhi; Wang Yang; He Jianhua

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Single event effect testing and radiation-hardened designing of several commercial optical transceivers

机译：单一事件效果测试和辐射 - 若干商业光学收发器的设计

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Single event effect susceptibility of several commercial transceivers are studied. In our testing, the receiver of the OLT transceiver and 12-channel receiver was tested for SEU only, and no latch-up and interrupt were observed during the exposure. However, the ONU transceiver, the 12-channel transmitter and the mini-optical transceiver module were tested for SEU, SEFI and the SEL. Based on results, we conclude that commercial components need to reinforce in order to be suitable for space application and discussed several radiation-hardened designing methods of optical transceivers. (C) 2017 Elsevier GmbH. All rights reserved.

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来源
《Optik: Zeitschrift fur Licht- und Elektronenoptik: = Journal for Light-and Electronoptic》 |2017年第2017期|共10页
作者
Zhan Yueying; Cao Suzhi; Wang Yang; He Jianhua;
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作者单位

Chinese Acad Sci Technol &

Engn Ctr Space Utilizat 9 Deng Zhuang South Rd Beijing 100094 Peoples R China;

Chinese Acad Sci Technol &

Engn Ctr Space Utilizat 9 Deng Zhuang South Rd Beijing 100094 Peoples R China;

Chinese Acad Sci Technol &

Engn Ctr Space Utilizat 9 Deng Zhuang South Rd Beijing 100094 Peoples R China;

Chinese Acad Sci Technol &

Engn Ctr Space Utilizat 9 Deng Zhuang South Rd Beijing 100094 Peoples R China;

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原文格式 PDF
正文语种 eng
中图分类光学;
关键词
Single event effect; Optical transceivers; Radiation-hardened designing;

机译：单一事件效果;光收发器;辐射硬化设计;

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1. Single event effect testing and radiation-hardened designing of several commercial optical transceivers [J] . Zhan Yueying, Cao Suzhi, Wang Yang, Optik: Zeitschrift fur Licht- und Elektronenoptik: = Journal for Light-and Electronoptic . 2017,第期

机译：单一事件效果测试和辐射 - 若干商业光学收发器的设计
2. Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMs [J] . Ladbury R.L., Berg M.D., Wilcox E.P., IEEE Transactions on Nuclear Science . 2013,第6aPart1期

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3. Single event test methodology and test results of commercial gigabit per second Fiber Channel hardware [J] . Carts M.A., Marshall P.W. IEEE Transactions on Nuclear Science . 1997,第6期

机译：商业千兆位每秒光纤通道硬件的单事件测试方法和测试结果
4. Single Event Effect Testing and Radiation-Hardened Designing for Optical Transceivers [C] . Yueying Zhan, Suzhi Cao, Yang Wang Asia Communications and Photonics Conference . 2016

机译：光收发器的单事件效果测试和辐射增强设计
5. Event-driven dynamic power-on for Giga-bit very short reach optical transceivers. [D] . Wang, Xingle. 2006

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7. 1 Single Event Effects and Total Dose Test Results for TI TLK2711 Transceiver [O] . R. Koga, P. Yu, J. George 2013

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Single event effect testing and radiation-hardened designing of several commercial optical transceivers

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