Morphological and optical properties of low temperature processed SnO        <sub xmlns='http://www.wiley.com/namespaces/wiley'>2</sub>2        :F

Uprety Prakash; Lambright Kelly J.; Grice Corey R.; Junda Maxwell M.; Giolando Dean M.; Podraza Nikolas J.

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Morphological and optical properties of low temperature processed SnO ₂2 :F

机译：低温加工单位的形态学和光学性质 _{2 2 ：F}

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> Thin films of transparent conducting fluorine doped tin oxide (SnO ₂ :F) on soda lime glass and stainless steel substrates are prepared by spray pyrolysis at low temperature ≤250?°C. Optical properties in the form of complex dielectric function ( ? ?=? ? _1? +?i ? ₂ ) spectra are obtained using spectroscopic ellipsometry from 0.035 to 5.89?eV for SnO ₂ :F on glass and from 0.75 to 5.89?eV for SnO ₂ :F on stainless steel. The absorption coefficient (α) spectra are extracted from spectra in ? for the film on soda lime glass from 0.035 to 5.89?eV and on stainless steel from 0.75 to 5.89?eV. Direct band gaps for SnO ₂ :F thin films on soda lime glass and stainless steel substrates are determined to be 3.45?±?0.01 and 3.60?±?0.01?eV, respectively. Infrared extended measurement shows an absorption feature at 0.063?eV (508?cm ?1 ) which may be attributed to Sn–O and Sn–F bonding. A broad background phonon absorption feature due to Sn–OH and O–H bonding is also identified at 0.3?eV (2420?cm ?1 ). Resistivity is deduced from ? . Improved agreement between optically and electrically determined resistivity is obtained when the infrared range spectrum is analyzed. The morphologies of both the films are studied by X‐ray diffraction (XRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM).

机译：透明导电氟掺杂氧化锡的薄膜（SNO _{2 ：f）在苏打石灰玻璃上，通过在低温≤250Ω℃下喷雾热解制备不锈钢基板。复合电介质功能形式的光学性质（？？=？？ _{1？ +？I. ？ _{2 ）光谱使用从0.035至5.89的光谱椭偏测量获得，为SNO _{2 ：玻璃上的f，0.75到5.89？ep for sno _{2 ：不锈钢上的f。吸收系数（α）光谱从光谱中提取？对于苏打石灰玻璃上的薄膜从0.035到5.89？EV和不锈钢从0.75到5.89？EV。直接乐队空白 _{2 ：苏打石灰玻璃和不锈钢基板上的F薄膜分别为3.45？±0.01和3.60？±0.01？EV。红外延长测量显示出0.063的吸收特征（508？cm ？1 ）这可能归因于SN-O和SN-F键合。由于Sn-OH和O-H键合引起的宽背景声子吸收特征也在0.3？EV（2420？cm ？1 ）。推导出电阻率？。当分析红外范围谱时，获得光学和电确定电阻率之间的改进的协议。通过X射线衍射（XRD），扫描电子显微镜（SEM）和原子力显微镜（AFM）研究了两种膜的形态。}}}}}}

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《Physica status solidi, B. Basic research》 |2017年第10期|共1页
作者
Uprety Prakash; Lambright Kelly J.; Grice Corey R.; Junda Maxwell M.; Giolando Dean M.; Podraza Nikolas J.;
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作者单位

Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and CommercializationUniversity of ToledoToledo OH 43606 USA;

Department of Chemistry and BiochemistryUniversity of ToledoToledo OH 43606 USA;

Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and CommercializationUniversity of ToledoToledo OH 43606 USA;

Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and CommercializationUniversity of ToledoToledo OH 43606 USA;

Department of Chemistry and BiochemistryUniversity of ToledoToledo OH 43606 USA;

Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and CommercializationUniversity of ToledoToledo OH 43606 USA;

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正文语种 eng
中图分类固体物理学;
关键词
complex dielectric function; optical properties; spectroscopic ellipsometry; tin oxide;

机译：复合介质功能;光学性质;光谱椭圆形;氧化锡;

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Morphological and optical properties of low temperature processed SnO ₂2 :F