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In-situ measurement of phospholipid nanodisk adhesion on a solid substrate using neutron reflectometry and atomic force microscopy

机译:使用中子反射测定法和原子力显微镜在固体基材上的磷脂纳米虫粘附的原位测量

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摘要

A substrate-supported phospholipid bilayer (SPB) is commonly used as a model bio-membranes on a solid substrate. The most common method to make SPBs is the adsorption followed by rupture of phospholipid vesicles on a substrate surface in contact with the vesicle solution. However, this method may present an applicability issue due to the limitation of combination of the phospholipids and substrates. On the other hand, adhesion of disklike micelles consisting of phospholipid, so-called bicelles, is a hopeful alternative method for making SPBs since they don't need the rupture process. The mechanism of the nanodisk adhesion on a substrate is, however, not fully understood yet. In this study, in-situ observation of the bicelle adhesion was performed using neutron reflectometry (NR), which can shed light on the depth profile of bilayer density at the interface between a substrate and bicelle solution. In addition, atomic force microscopy (AFM) was employed for the topographic imaging and force response measurement of the adhesion layer. These results presented that lamellae of phospholipid bilayers were aligned parallel to a surface of a bare Si substrate, whereas a fragile layer of unoriented phospholipid bilayers was formed on a NH2 coated Si substrate.
机译:基材负载的磷脂双层(SPB)通常用作固体基质上的模型生物膜。制备SPB的最常用方法是吸附,然后在与囊泡溶液接触的基板表面上破裂磷脂囊泡。然而,由于磷脂和基材的组合的限制,该方法可以提出适用性问题。另一方面,磷脂胶束由磷脂,所谓的双氯氏细胞组成的粘附性是制造SPB的一种充满希望的方法,因为它们不需要破裂过程。然而,纳米磁盘粘附在基板上的粘附机理尚未完全理解。在该研究中,使用中子反射仪(NR)进行原位观察双螺纹粘附,这可以在基板和双螺纹溶液之间的界面处的双层密度的深度曲线上脱光。另外,采用原子力显微镜(AFM)用于粘合层的地形成像和力响应测量。这些结果表明,磷脂双层的薄片平行于裸SI衬底的表面对齐,而在NH 2涂覆的Si衬底上形成脆弱的未定位的磷脂双层。

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