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Controlling the Roughness of Langmuir-Blodgett Monolayers

机译:控制Langmuir-Blodgett Monolayers的粗糙度

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摘要

Controlling the surface roughness of thin films with nanoscale precision is of significant interest for the rational design of surface coatings. Although wrinkling and buckling of Langmuir monolayers under compression has been demonstrated for several years, there is currently no method to precisely control this behavior during compression and thereby modify the surface roughness of deposited films. Here, we combine conventional Langmuir phase analysis with a novel dynamic viscoelasticity measurement to simply and accurately observe the jamming transition of monolayers of silica spheres, graphene oxide, and surfactant. By overcompressing beyond this point, the surface roughness of the deposited monolayer can be precisely controlled. This technique could be used to tune the surface properties of a variety of materials from lipids to nanoparticles.
机译:用纳米级精度控制薄膜的表面粗糙度对表面涂层的合理设计具有重要兴趣。 尽管在压缩下的兰姆润单层的皱纹和屈曲已经证明了几年,但目前没有在压缩期间精确地控制这种行为的方法,从而改变沉积薄膜的表面粗糙度。 在这里,我们将常规的Langmuir相位分析与新的动态粘弹性测量相结合,简单准确地观察二氧化硅球,石墨烯和表面活性剂的单层的干扰转变。 通过超越这一点,可以精确地控制沉积的单层的表面粗糙度。 该技术可用于将各种材料的表面性质从脂质曲调到纳米颗粒。

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