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首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >Quantification of non-bridging oxygens in silicates using X-ray Raman scattering
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Quantification of non-bridging oxygens in silicates using X-ray Raman scattering

机译：使用X射线拉曼散射定量硅酸盐中的非桥接氧

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摘要

Detecting and quantifying non-bridging oxygen (NBO) atoms is of particular interest for understanding the physical properties of melts or compressed materials, and requires an unequivocal spectral signature usable during in situ measurements. In this paper, we evidence a low-energy feature of NBO in lithium silicate crystals using X-ray Raman scattering (XRS) spectroscopy around the energy losses of the oxygen K-edge. A specific peak at 534-535 eV in the edge onset is unequivocally attributed to the presence of NBO. Its intensity is used to quantify NBO in lithium silicate glasses. A similar feature at low energy has also been evidenced in Na2SiO3 and MgSiO3, generalizing the method to other alkali and alkali-earth silicates. This non-destructive method of NBO quantification, which is based on an X-ray inelastic scattering technique, can be extended to other spectroscopies such as electron-energy loss spectroscopy, and soft X-ray absorption spectroscopy at the oxygen K edge.
机译：检测和定量非桥接氧（NBO）原子特别感兴趣地理解熔体或压缩材料的物理性质，并且需要在原位测量期间可用的明确谱签名。 在本文中，我们证明了在氧气K缘的能量损失周围的X射线拉曼散射（XRS）光谱法中的锂硅酸锂晶体中NBO的低能量特征。 在边缘发作中534-535eV的特定峰明确归因于NBO的存在。 它的强度用于量化硅酸锂玻璃中的NBO。 在Na 2 SiO 3和MgSiO 3中也证明了低能量的类似特征，将该方法推广给其他碱和碱土硅酸盐。 这种基于X射线非弹性散射技术的NBO定量的这种非破坏性方法可以扩展到氧气k边缘的电子能损光谱和软X射线吸收光谱等其他光谱。

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