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Ultraviolet photodetector based on heterojunction of n-ZnO microwire/p-GaN film

机译:基于N-ZnO微针/ P-GaN膜的异质结的紫外光探测器

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摘要

High quality ZnO microwires have been fabricated by chemical vapor deposition method. Ultraviolet photodetector based on heterojunction of n-ZnO (individual microwire)/p-GaN film was fabricated. The current-voltage characteristic of the photodetector was investigated, which showed that the heterojunction had rectifying behavior with rectification ratio (I-forward/I-reverse) of about 6.3 x 10(2) at 4 V. The photoresponse spectrum displayed a sharp cut-off at the wavelength of 380 nm, and the photoresponsivity was as high as 0.45 A W-1 at 0 V and 1.3 A W-1 at 2.5 V reverse bias. The ultraviolet-visible rejection ratio (R370 nm/R450 nm) is three orders of magnitude under zero bias.
机译:通过化学气相沉积方法制造了优质的ZnO微线。 制造了基于N-ZnO(个体微线)/ p-GaN膜的异质结的紫外线光电探测器。 研究了光电探测器的电流 - 电压特性,表明异质结具有在4V的4V中的整流比(I-Deadon / I反向)的整流行为。光响应频谱显示出急剧切割 在380nm的波长处的-off,并且光响应性高达0.45A W-1,在0V和1.3AW-1处,在2.5V反向偏压。 紫外 - 可见抑制比(R370 nm / R450nm)是零偏压下的三个数量级。

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  • 来源
    《RSC Advances》 |2015年第2期|共5页
  • 作者单位

    Univ Jinan Sch Phys &

    Technol Jinan 250022 Peoples R China;

    Chinese Acad Sci Changchun Inst Opt Fine Mech &

    Phys Lab Excited State Proc Changchun 130021 Peoples R China;

    Jilin Univ Dept Phys Changchun 130023 Peoples R China;

    Western Digital Co Mat Characterizat Grp Fremont CA 94539 USA;

    Univ Jinan Sch Phys &

    Technol Jinan 250022 Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化学;
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