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Multi-temperature structure of thermoelectric Mg_2Si and Mg_2Sn

机译:热电MG_2SI和MG_2SN的多温度结构

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A multi-temperature structural study of Mg_2Si and Mg_2Sn was carried out from 100 to 700 K using synchrotron X-ray powder diffraction. The temperature dependence of the lattice parameters can be expressed as a = 6.3272 (4) + 6.5 (2) × 10~(-5)T + 4.0 (3) × 10~(-8)T~2 ? and a = 6.7323 (7) + 8.5 (4) × 10~(-5)T + 3.8 (5) × 10~(-8)T~2 ? for Mg_2Si and Mg_2Sn, respectively. The atomic displacement parameters (ADPs) are reported and analysed using a Debye model for the averaged Uiso giving Debye temperatures of 425 (2) K for Mg_2Si and 243 (2) K for Mg_2Sn. The ADPs are considerably smaller for Mg_2Si than for Mg_2Sn reflecting the weaker chemical bonding in the Mg_2Sn structure. Following the heating, an annealing effect is observed on the lattice parameters and peak widths in both structures, presumably due to changes in the crystal defects, but the lattice thermal expansion is almost unchanged by the annealing. This work provides accurate structural parameters which are of importance for studies of Mg_2Si, Mg_2Sn and their solid solutions.
机译:使用同步辐射X射线粉末衍射从100至700k进行Mg_2Si和Mg_2Sn的多温度结构研究。晶格参数的温度依赖性可以表示为= 6.3272(4)+ 6.5(2)×10〜(-5)T + 4.0(3)×10〜(-8)T〜2? A = 6.7323(7)+ 8.5(4)×10〜(-5)T + 3.8(5)×10〜(-8)T〜2?对于MG_2SI和MG_2SN。报告原子位移参数(ADP)并使用DEYBES模型进行分析,用于平均UISO,给予MG_2SI的MG_2SI和243(2)k的425(2)K的DEYYE温度。 Mg_2SI的ADP比MG_2SN相当较小,而MG_2SN反射MG_2SN结构中较弱的化学键合。在加热之后,在晶格参数和两个结构中的峰宽的峰值宽度观察退火效果,可能是由于晶体缺陷的变化,但是通过退火几乎不变地保持晶格热膨胀。这项工作提供了准确的结构参数,其对MG_2SI,MG_2SN及其固体解决方案的研究非常重要。

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