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Infiltration growth and crystallization characterization of single-grain Y-bA-CU-O bulk superconductors

机译：单晶Y-bA-CU-O块状超导体的渗透生长和结晶特性

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摘要

A series of single-grain Y-Ba-Cu-O (YBCO) bulk superconductors were fabricated using a modified infiltration growth (IG) technique, and the morphology feature associated with the inner crystallization structure of the samples was investigated in detail. Experimental observations indicated that YBCO single grains grew much larger with the increasing slow-cooling time. A bended a/c growth sector boundary was observed in the cross section of the YBCO sample grown for 48 h, which resulted from the variations in the R _a/R_c ratio during the slow-cooling growth process, where Ra and Rc represent the growth rate in the a axis and c axis direction, respectively. In addition, different side surface morphology (SSM) patterns were presented for the samples fabricated with different processings, which originated from the difference in the crystallization structure of the YBCO single grains and could be divided into four groups. On the other hand, for a defined inner-crystallization structure, the changes of sample size (diameter or thickness) could also lead to various SSM styles. Finally, it was concluded that the comparison relationship between the ratio of sample radius and thickness with the ratio of Ra/Rc determined the final SSM pattern of the sample.
机译：利用改进的渗透生长（IG）技术制备了一系列单晶Y-Ba-Cu-O（YBCO）块状超导体，并详细研究了与样品内部结晶结构相关的形貌特征。实验观察表明，随着慢冷时间的增加，YBCO单晶晶粒长大得多。在生长48 h的YBCO样品的横截面中观察到弯曲的a / c生长扇区边界，这是由于在缓慢冷却生长过程中R _a / R_c比值的变化而引起的，其中Ra和Rc代表生长沿a轴和c轴方向的速度。此外，对于不同加工工艺制备的样品，呈现出不同的侧面形态（SSM）图，这是由于YBCO单晶的结晶结构不同而引起的，可分为四类。另一方面，对于定义的内部结晶结构，样品大小（直径或厚度）的变化也可能导致各种SSM样式。最后，得出结论，样品半径与厚度之比与Ra / Rc之比之间的比较关系决定了样品的最终SSM模式。

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