Low-voltage scanning electron microscopy of multilayer polymer systems

Orekhov A. S.; Klechkovskaya V. V.; Kononova S. V.

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Low-voltage scanning electron microscopy of multilayer polymer systems

机译：多层聚合物系统的低压扫描电子显微镜

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The possibilities of low-voltage scanning electron microscopy for visualization of specific features of the microstructure in internal layers of multilayer polymer films are demonstrated by the example of "chitosan-polyelectrolyte complex-alginic acid" composite. The process of electron beam interaction with a sample at low electron energies is considered. The key parameters of low-voltage electron microscopy, which make it possible to increase the resolution of SEM images of polymer systems, are discussed.

机译：通过“壳聚糖 - 聚电解质复合 - 海藻酸”复合材料的实施例证明了用于在多层聚合物膜的内层的微观结构中微观结构的特定特征可视化的可能性。考虑了在低电子能量下与样品的电子束相互作用的过程。讨论了低压电子显微镜的关键参数，这使得可以增加聚合物系统的SEM图像的分辨率。

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来源
《Crystallography reports》 |2017年第5期|共6页
作者
Orekhov A. S.; Klechkovskaya V. V.; Kononova S. V.;
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作者单位

Natl Res Ctr Kurchatov Inst Moscow 123182 Russia;

Russian Acad Sci Fed Sci Res Ctr Crystallog &

Photon Shubnikov Inst Crystallog Moscow 119333 Russia;

Russian Acad Sci Inst Macromol Cpds St Petersburg 199004 Russia;

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正文语种 eng
中图分类晶体学;
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1. Low-voltage scanning electron microscopy of multilayer polymer systems [J] . Orekhov A. S., Klechkovskaya V. V., Kononova S. V. Crystallography reports . 2017,第5期

机译：多层聚合物系统的低压扫描电子显微镜
2. Imaging of Semiconducting Polymer Blend Systems Using Environmental Scanning Electron Microscopy and Environmental Scanning Transmission Electron Microscopy [J] . S. J. WILLIAMS, D. E. MORRISON, B. L. THIEL, Scanning . 2005,第4期

机译：使用环境扫描电子显微镜和环境扫描透射电子显微镜对半导体聚合物共混体系进行成像
3. Publisher’s Note: “Direct observation and analysis of yolk-shell materials using low-voltage high-resolution scanning electron microscopy: Nanometal-particles encapsulated in metal-oxide, carbon, and polymer” [APL Mater. 2, 113317 (2014)] [J] . Shunsuke Asahina, Mitsuo Suga, Hideyuki Takahashi, APL Materials . 2015,第2期

机译：发行人注：“使用低压高分辨率扫描电子显微镜直接观察和分析蛋黄壳材料：包裹在金属氧化物，碳和聚合物中的纳米金属颗粒” [APL Mater。 2，113317（2014）]
4. Nanoscale Electronic Properties of a Model System and of a Conjugated Polymer Compound by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy [C] . Ling Sun, Jianjun Wang, Elmar Bonaccursor, American Chemical Society . 2010

机译：纳米级电子性质的模型系统和缀合的聚合物化合物通过开尔文探针力显微镜和扫描导电扭转模式显微镜
5. Simultaneous Bright-Field and Dark-Field Scanning Transmission Electron Microscopy in Scanning Electron Microscopy: A New Approach for Analyzing Polymer System Morphology. [D] . Patel, Binay S. 2013

机译：扫描电子显微镜中同时进行的明场和暗场扫描透射电子显微镜：一种分析聚合物系统形态的新方法。
6. High-resolution Visualization of the Microbial Glycocalyx with Low-voltage Scanning Electron Microscopy: Dependence on Cationic Dyes [O] . Stanley L. Erlandsen, Christopher J. Kristich, Gary M. Dunny, 2004

机译：低压扫描电子显微镜对微生物糖萼的高分辨率可视化：对阳离子染料的依赖
7. Publisher’s Note: “Direct observation and analysis of yolk-shell materials using low-voltage high-resolution scanning electron microscopy: Nanometal-particles encapsulated in metal-oxide, carbon, and polymer” [APL Mater. 2, 113317 (2014)] [O] . Shunsuke Asahina, Mitsuo Suga, Hideyuki Takahashi, 2015

机译：出版商注：“使用低压高分辨率扫描电子显微镜直接观察和分析蛋黄壳材料：纳米金属颗粒包裹在金属氧化物，碳和聚合物中”[apL mater。 2,113317（2014）]

Low-voltage scanning electron microscopy of multilayer polymer systems

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