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Nanoindentation method to study slip planes in molecular crystals in a systematic manner

机译:纳米压痕法系统研究分子晶体中的滑移面

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摘要

A rotating sample method has been developed to study the slip planes of succinic acid by atomic force microscopy (AFM) nanoindentation. A nonaxisymmetric cube corner indenter was utilized to generate an inhomogeneous stress field, which selectively activates different slip systems simply by rotating the sample. The slip planes identified were repeatable and frequently observed for different indentations of the single crystals using four sample rotations. By applying this rotating sample method to both (001) and (010) crystal faces, the repeatedly observed major slip planes were identified as (010) and (111) planes; these agree with the theoretical prediction. Many higher index operative slip planes were identified that were not reported previously. The rotating sample method presented herein is pragmatic and suggests that the anisotropic slip properties of single pharmaceutical crystals can be studied in a systematic manner.
机译:已开发出一种旋转样品方法,以通过原子力显微镜(AFM)纳米压痕研究琥珀酸的滑移面。利用非轴对称立方角压头生成不均匀的应力场,该应力场仅通过旋转样品即可选择性激活不同的滑移系统。识别出的滑移面是可重复的,并且使用四个样本旋转经常观察到单晶的不同压痕。通过将此旋转采样方法应用于(001)和(010)晶面,可以将反复观察到的主滑动面识别为(010)和(111)面;这些与理论预测相符。确定了许多以前没有报道过的更高指数的手术滑架。本文介绍的旋转采样方法是实用的,表明可以以系统的方式研究单一药物晶体的各向异性滑移特性。

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