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首页> 外文期刊>Crystal growth & design >Substrate-Dependent Orientation and Polytype Control in SiC Nanowires Grown on 4H-SiC Substrates
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Substrate-Dependent Orientation and Polytype Control in SiC Nanowires Grown on 4H-SiC Substrates

机译:4H-SiC衬底上生长的SiC纳米线中与衬底有关的取向和多型性控制

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摘要

SiC nanowires were grown on monocrystalline 4H-SiC wafers by chemical vapor deposition using the vapor-liquid-solid growth mode. The growth direction of the nanowires was dictated by the crystallographic orientation of the 4H-SiC substrates. Two distinct types of nanowires were obtained. The first type crystallized in the 3C polytype with the ?111? nanowire axes. These nanowires grew at 20o with respect to the substrate c-planes and exhibited high densities of stacking faults on those {111} planes that are parallel to the substrate c-planes. The second type featured the 4H structure albeit with a strong stacking disorder. The stacking faults in these nanowires were perpendicular to the [0001] nanowire axes. Possible growth mechanisms that led to the formation of 3C and 4H polytypes are discussed.
机译:通过使用气-液-固生长模式的化学气相沉积法,在单晶4H-SiC晶片上生长SiC纳米线。纳米线的生长方向取决于4H-SiC衬底的晶体学取向。获得了两种不同类型的纳米线。第一种在3C多晶型中结晶,带有“ 111”。纳米线轴。这些纳米线相对于衬底c平面以20o的速度生长,并且在平行于衬底c平面的{111}平面上表现出高密度的堆垛层错。第二种类型具有4H结构,尽管具有很强的堆叠障碍。这些纳米线中的堆垛层错垂直于[0001]纳米线轴。讨论了导致3C和4H多型形成的可能的生长机制。

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