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首页> 外文期刊>Crystal growth & design >Electron Backscatter Diffraction of Fresnoite Crystals Grown from the Surface of a 2BaO center dot TiO2 center dot 2.75SiO(2) Glass
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Electron Backscatter Diffraction of Fresnoite Crystals Grown from the Surface of a 2BaO center dot TiO2 center dot 2.75SiO(2) Glass

机译：从2BaO中心点TiO2中心点2.75SiO（2）玻璃的表面生长的弗氏体晶体的电子背散射衍射

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A glass with the composition 2BaO center dot TiO2 center dot 2.75SiO(2) was annealed at 810 degrees C for 20 h. This led to surface crystallization. Immediately at the surface of the sample, a layer of Ba2TiSi2O8-type fresnoite crystals (layer I), with a thickness of approximately 7 mu m, oriented with the crystallographic [101]-direction perpendicular to the surface, was formed. The pole of the (001)-plane rotates randomly around the [101]-direction. It is assumed that nucleation kinetics is decisive to the direction of growth. In the next layer (layer II), the crystals are oriented with the crystallographic [001]-direction (c-axis) perpendicular to the surface of the sample. This layer occurs at a distance of 7-60 mu m from the surface. Here, crystals that are not oriented in that way hinder each other during crystal growth. At a distance > 60 mu m, the orientation of the fresnoite crystals is random and is the result of volume crystallization. The main characterization method is electron backscatter diffraction/orientation imaging microscopy.
机译：将组成为2BaO中心点TiO2中心点2.75SiO（2）的玻璃在810摄氏度下退火20小时。这导致表面结晶。立即在样品表面上形成一层Ba2TiSi2O8型奥氏体晶体（层I），其厚度约为7μm，其晶体学[101]方向垂直于该表面。 （001）平面的极点绕[101]方向随机旋转。假定成核动力学对生长方向起决定性作用。在下一层（层II）中，晶体以垂直于样品表面的晶体学[001]方向（c轴）取向。该层与表面的距离为7-60微米。在此，未以这种方式取向的晶体在晶体生长期间会相互阻碍。在＞60μm的距离处，马氏体晶体的取向是随机的，并且是体积结晶的结果。主要表征方法是电子背散射衍射/定向成像显微镜。

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