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首页> 外文期刊>International Journal of Plasticity >Size and stress dependences in the tensile stress relaxation of thin copper wires at room temperature
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Size and stress dependences in the tensile stress relaxation of thin copper wires at room temperature

机译:在室温下薄铜线的拉伸应力松弛的尺寸和应力依赖性

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摘要

The tensile stress relaxation behavior of thin copper wires with diameters of 20, 35 and 50 pm is experimentally investigated at room temperature. It is revealed that the stress relaxation can occur at low starting stress below the yield strength at room temperature. Significant size and stress dependences in the stress relaxation are observed. That is at a given stress, a smaller diameter sample exhibits a much faster stress relaxation. At a given diameter, the stress relaxation is accelerated with increasing the starting stress. The value of activation volume increases with increasing the wire diameter, while it increases with decreasing the starting stress. The strain rate elevates as the wire diameter decreases or the starting stress increases. A bilinear relation between the logarithmic strain rate and the logarithmic stress during the relaxation is observed only for the wire sample with a diameter of 20 pm. The intersection of dislocations with grain boundaries is considered to be the main deformation mechanism during the stress relaxation. A rapider exhaustion of mobile dislocations is observed in the wire with smaller diameter in the primary of relaxation. It is attributed to annihilation of dislocations easily escaping from the surface due to larger fraction volume of the near-surface zone. After the primary regime, the higher possibility of dislocations being pinned or immobilized by grain boundaries in a larger-diameter sample is accounted for the size dependence.
机译:在室温下实验研究直径为20,35和50μm的薄铜线的拉伸应力松弛行为。据透露,应力松弛可以在室温下低于屈服强度的低的起始应力发生。观察到应力松弛的显着尺寸和应力依赖性。即在给定的应力,较小的直径样本表现出更快的应力松弛。在给定直径,随着增加的起始应力,应力松弛加速。随着线径的增加,激活体积的值随着导线的增加而增加,同时随着降低的起始应力而增加。随着线径降低或起始应力增加,应变率升高。仅针对直径20μm的线材样品观察到放松期间的对数应变速率与对数应力之间的双线性关系。具有晶界的脱位被认为是应力松弛期间的主要变形机制。在释放较小的直径下,在宽度下较小的电线观察到移动脱位的耐辐射耗尽。由于近表面区的较大级分体积,因此归因于位于表面容易从表面逸出的湮灭。在主要制度之后,尺寸依赖性地占据较大直径样品中的晶界固定或固定的脱位的较高可能性。

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