Crack growth characterization in single-edge notched tension testing by means of direct current potential drop measurement
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Crack growth characterization in single-edge notched tension testing by means of direct current potential drop measurement

机译：通过直流电位降测量通过直接电流下降测量来裂纹生长特性

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AbstractSingle-edge notched tension (SENT) testing has gained attention for the characterization of crack growth resistance in scenarios of low crack tip constraint conditions. One challenge of SENT testing is the experimental characterization of crack extension during the test. Two common methods exist: unloading compliance and direct current potential drop (DCPD). Whereas the former method is fairly extensively described in existing procedures, applying the latter mostly depends on user experience and in-house developed analysis algorithms. This paper describes Ghent University's approach for DCPD measurements of ductile crack extension in SENT testing. A reference voltage drop measurement is advised, aiming to account for current leak and changes in electrical conductivity. Then, attention goes to the sensitivity of the procedure with respect to changes in crack size and its robustness with respect to probe positioning errors. Finally, DCPD is shown to have similar capabilities to unloading compliance with respect to defect sizing accuracy. The results of this paper are aimed to contribute to a more prescriptive description of DCPD measurements in revised SENT test procedures or standards.Highlights?A procedure is presented to measure crack growth in SENT testing by means of DCPD.?A dual probe technique eliminates effects of current leak and temperature change.?Positions for current pins and measurement probes are motivated.?Crack growth is estimated with an accuracy similar to unloading compliance.?Weld metal specimens have larger crack sizing errors than base metal specimens.]]>
机译：<！[CDATA [ 抽象 单边缘缺口张力（发送）测试已经注意到低低的情况下的裂纹生长阻力裂缝尖端约束条件。发送测试的一个挑战是测试期间裂缝延伸的实验表征。存在两种常见方法：卸载顺应性和直流潜在液滴（DCPD）。然而，以前的方法在现有程序中相当广泛地描述，施加后者主要取决于用户体验和内部开发的分析算法。本文介绍了根特大学对送视中的延展性裂纹扩展的DCPD测量方法。建议参考电压降测量，旨在考虑电流泄漏和导电性的变化。然后，关注关于突变大小的变化以及关于探针定位误差的鲁棒性的变化的灵敏度。最后，DCPD被示出具有类似的能力来卸载遵守缺陷尺寸精度的缺陷。本文的结果旨在有助于更加规范的DCPD测量在经修订的测试程序或标准中进行DCPD测量的描述。 亮点 ？< / ce：标签> 提出了一种过程，以通过DCPD来测量发送测试的裂缝增长。 ？ Positi用于当前引脚和测量探针的ONS是有动力的。 ？ 估计裂缝增长，精度类似于卸载合规性。 ？ 焊接金属样品比贱金属样品更大的裂缝尺寸误差。 ]]>

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