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首页> 外文期刊>ACS nano >Two-Dimensional Pattern Formation Using Graphoepitaxy of PS?b?PMMA Block Copolymers for Advanced FinFET Device and Circuit Fabrication
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Two-Dimensional Pattern Formation Using Graphoepitaxy of PS?b?PMMA Block Copolymers for Advanced FinFET Device and Circuit Fabrication

机译:使用PS?b?PMMA嵌段共聚物的石墨外延进行二维图形形成,用于先进的FinFET器件和电路制造

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摘要

Directed self-assembly (DSA) of lamellar phase block-copolymers (BCPs) can be used to form nanoscale line-space patterns. However, exploiting the potential of this process for circuit relevant patterning continues to be a major challenge. In this work, we propose a way to impart two-dimensional pattern information in graphoepitaxybased lamellar phase DSA processes by utilizing the interactions of the BCP with the template pattern. The image formation mechanism is explained through the use of Monte Carlo simulations. Circuit patterns consisting of the active region of Si FinFET transistors, referred to as Si “fins”, were fabricated to demonstrate the applicability of this technique to the formation of complex patterns. The quality of the Si fin features produced by this process was validated by demonstrating the first functional DSA-patterned FinFET devices with 29 nm-pitch fins.
机译:层状相嵌段共聚物(BCP)的直接自组装(DSA)可用于形成纳米级的行空间图案。然而,利用该工艺的潜力进行电路相关的图案化仍然是主要挑战。在这项工作中,我们提出了一种通过利用BCP与模板图案的相互作用在基于石墨外延的层状相DSA过程中传递二维图案信息的方法。通过使用蒙特卡洛模拟来解释图像形成机理。制作了由Si FinFET晶体管的有源区组成的电路图案,称为Si“鳍”,以证明该技术可用于形成复杂图案。通过演示第一个具有29 nm间距鳍片的功能DSA图案化FinFET器件,验证了此工艺产生的Si鳍片特征的质量。

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