The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals

Estevez-Rams E; Penton A; Martinez-Garcia J; Fuess H

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The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals

机译：使用解析峰轮廓函数拟合平面断层晶体的衍射数据

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The implication of the use of particular peak profile functions in the fit of diffraction data on the nature and density of stacking faults in layered solids is studied. Common type of profile functions are studied: Gauss, Lorentz, pseudoVoigt and Pearson VII. An additional peak profile is introduced. For each profile function the decaying term of the probability correlation function is determined and the expression for the correlation length is deduced. The form of the asymmetric component of each profile is also reported. Experimental data is fitted using each profile and the results are discussed.

机译：研究了在衍射数据的拟合中使用特定峰轮廓函数对层状固体中堆垛层错的性质和密度的影响。研究了常见的轮廓函数类型：高斯，洛伦兹，pseudoVoigt和Pearson VII。引入了另一个峰轮廓。对于每个轮廓函数，确定概率相关函数的衰减项，并推导相关长度的表达式。还报告了每个轮廓的不对称分量的形式。使用每个配置文件拟合实验数据并讨论结果。

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《Crystal Research and Technology: Journal of Experimental and Industrial Crystallography》 |2005年第2期|共11页
作者
Estevez-Rams E; Penton A; Martinez-Garcia J; Fuess H;
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正文语种 eng
中图分类晶体学;
关键词
XRD pattern; peak profile functions; stacking faults; X-RAY-DIFFRACTION; STACKING-FAULTS; DIFFUSE-SCATTERING; POWDER-DIFFRACTION; EVOLUTION; PATTERN;

机译：X射线衍射图;峰轮廓函数;堆垛层错;X射线衍射;堆积缺陷;扩散散射;粉末衍射;演变;模式;

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1. The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals [J] . Estevez-Rams E, Penton A, Martinez-Garcia J, Crystal Research and Technology: Journal of Experimental and Industrial Crystallography . 2005,第1a2期

机译：使用解析峰轮廓函数拟合平面断层晶体的衍射数据
2. MWP-fit: a program for multiple whole-profile fitting of diffraction peak profiles by ab initio theoretical functions [J] . Ribarik G., Gubicza J., Ungar T. Journal of Applied Crystallography . 2001,第5期

机译：MWP-fit：通过从头算起的理论函数对衍射峰轮廓进行多个全轮廓拟合的程序
3. Planar faults in layered Bi-containing perovskites studied by X-ray diffraction line profile analysis [J] . Boulle A., Guinebretiere R., Mercurio JP., Journal of Applied Crystallography . 2001,第6期

机译：X射线衍射线轮廓分析研究层状含Bi钙钛矿中的平面断层
4. Analytical fits to hadron-hadron differential cross section data at the diffraction peak [C] . R. F. Avila, S. D. Campos, M. J. Menon, International Workshop on Relativistic Aspects of Nuclear Physics . 2004

机译：分析适合于衍射峰处的Holron-Holron差分横截面数据
5. Diffraction interface theory & planar layered media. [D] . Roberts, Christopher M. 2015

机译：衍射界面理论和平面分层介质。
6. Improving the accuracy and resolution of neutron crystallographic data by three-dimensional profile fitting of Bragg peaks in reciprocal space [O] . Brendan Sullivan, Rick Archibald, Patricia S. Langan, -1

机译：通过倒数空间中布拉格峰的三维轮廓拟合提高中子晶体学数据的准确性和分辨率
7. MWP-fit: a program for multiple whole-profile fitting of diffraction peak profiles by ab initio theoretical functions [O] . Ribárik Gábor, Ungár Tamás, Gubicza Jenő 2001

机译：MWP-fit：从头算理论函数对衍射峰轮廓进行多个全轮廓拟合的程序

The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals

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