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首页> 外文期刊>Crystal Research and Technology: Journal of Experimental and Industrial Crystallography >Effect of annealing temperature on the structural and optical properties of amorphous Sb2Te2Se thin films
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Effect of annealing temperature on the structural and optical properties of amorphous Sb2Te2Se thin films

机译:退火温度对非晶态Sb2Te2Se薄膜结构和光学性能的影响

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摘要

Thin films of Sb2Te2Se were prepared by conventional thermal evaporation of the presynthesized material on Coming glass substrates. The chemical composition of the samples was determined by means of energy-dispersive X-ray spectrometry. X-ray diffraction studies on the as-deposited and annealed films revealed an amorphous-to-crystalline phase transition. The as-deposited and annealed films at T-a = 323 and 373 K are amorphous, while those annealed at T-a= 423 and 473 K are crystalline with a single-phase of a rhombohedral crystalline structure as that of the source material. The unit-cell lattice parameters were determined and compared with the reported data. The optical constants (n, k) of the investigated films were determined from the transmittance and reflectance data at normal incidence in the spectral range 400-2500 nm. The analysis of the absorption spectra revealed non-direct energy gaps, characterizing the amorphous films, while the crystalline films exhibited direct energy gaps. (c) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
机译:Sb2Te2Se薄膜是通过在Coming玻璃衬底上常规热蒸发预合成材料而制备的。样品的化学组成通过能量色散X射线光谱法测定。对沉积和退火后的薄膜进行X射线衍射研究,发现了非晶态至晶态的相变。在T-a = 323和373K下沉积和退火的膜是非晶态的,而在T-a = 423和473K下退火的膜是结晶的,具有作为源材料的单面菱形晶体结构。确定了晶胞参数,并将其与报告的数据进行比较。根据在400-2500nm光谱范围内法向入射的透射率和反射率数据确定所研究膜的光学常数(n,k)。吸收光谱的分析显示出非直接能隙,表征非晶膜,而结晶膜表现出直接能隙。 (c)2005 WILEY-VCH Verlag GmbH&Co. KGaA,Weinheim。

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