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首页> 外文期刊>Micron: The international research and review journal for microscopy >Plan-view characterization of intergranular precipitates on grain boundaries by combination of FIB lift out method and TEM analyses: A case study in austenitic stainless steel
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Plan-view characterization of intergranular precipitates on grain boundaries by combination of FIB lift out method and TEM analyses: A case study in austenitic stainless steel

机译：FIB升降方法和TEM分析的组合晶体沉淀物的平面图表征晶界晶界 - 奥氏体不锈钢案例研究

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摘要

A new characterization method is proposed to study intergranular precipitates of polycrystalline material in the planar manner. A dual beam focused ion beam (FIB) scanning electron microscopy (SEM) was applied to fabricate thin FIB lamella with a grain boundary parallel to the lamella to investigate for transmission electron microscopy (TEM). Distributions, microstructures and compositions of intergranular precipitates of austenitic stainless steel were then examined by TEM, scanning transmission electron microscopy (STEM), and energy dispersive X-ray spectroscopy (EDS). This plan-view microstructural characterization methods would play im-portant roles in the case of materials where the intergranular precipitates play key roles for their physical and chemical properties.
机译：提出了一种新的表征方法，以研究平面方式的多晶材料的晶间沉淀。 施加双光束聚焦离子束（FIB）扫描电子显微镜（SEM）以制造薄的FIB薄片，与薄片与薄片平行，以研究透射电子显微镜（TEM）。 然后通过TEM，扫描透射电子显微镜（茎）和能量分散X射线光谱（EDS）进行奥氏体不锈钢晶体沉淀物的分布，微观结构和组合物。 该平面图微结构表征方法将在晶间沉淀物为其物理和化学性质发挥关键作用的情况下发挥IM-头部角色。

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