...
首页> 外文期刊>Crystallography reports >Peculiarities of Section Topograms for the Multiple Diffraction of X Rays
【24h】

Peculiarities of Section Topograms for the Multiple Diffraction of X Rays

机译:X射线多次衍射的截面形貌特征

获取原文
获取原文并翻译 | 示例
           

摘要

The distortion of interference fringes on the section topograms of single crystal due to the multiple diffraction of X rays has been investigated. The cases of the 220 and 400 reflections in a silicon crystal in the form of a plate with a surface oriented normally to the [001] direction are considered both theoretically and experimentally. The same section topogram exhibits five cases of multiple diffraction at small azimuthal angles for the 400 reflection and MoK alpha radiation, while the topogram for the 220 reflection demonstrates two cases of multiple diffraction. All these cases correspond to different combinations of reciprocal lattice vectors. Exact theoretical calculations of section topograms for the aforementioned cases of multiple diffraction have been performed for the first time. The section topograms exhibit two different distortion regions. The distortions in the central region of the structure are fairly complex and depend strongly on the azimuthal angle. In the tails of the multiple diffraction region, there is a shift of two-beam interference fringes, which can be observed even with a laboratory X-ray source.
机译:已经研究了由于X射线的多次衍射导致的单晶截面形貌图上干涉条纹的畸变。在理论上和实验上都考虑了板状硅晶体中具有垂直于[001]方向定向的板中的220和400反射的情况。对于400反射和MoK alpha辐射,同一截面的地形图在小方位角下显示了五种情况的多重衍射,而对于220反射的地形图显示了两种情况下的多重衍射。所有这些情况对应于倒易晶格矢量的不同组合。首次对上述多重衍射情况下的截面形貌进行了精确的理论计算。截面拓扑图显示两个不同的变形区域。结构中心区域的变形非常复杂,并且很大程度上取决于方位角。在多重衍射区域的尾部,存在两束干涉条纹的偏移,即使使用实验室X射线源也可以观察到。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号