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Diffusion of Intrinsic Defects in Dielectric and Semiconductor Crystals with Impurities

机译:杂质中介电和半导体晶体中本征缺陷的扩散

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This paper reports on the results of detailed theoretical investigations into the diffusion of intrinsic defects in impurity crystals doped with mixed-valence ions. The special case of diffusion stimulated by variations in the redox properties of the atmosphere at the crystal boundary during high-temperature annealing is analyzed. The major consideration is given to the following fundamental problems: (i) the dynamics of valence transitions and the structure of the chemical reaction zone, (ii) the possibility of determining the type of chemical reaction at the crystal-atmosphere interface and the type of diffusing defects, (iii) the effect of dilation mechanical stresses arising in the reaction zone on the reaction-zone structure and on the dynamics of diffusion processes, and (iv) the determination of the diffusion parameters of intrinsic defects and the constants of their interaction with impurity centers.
机译:本文报道了详细的理论研究结果,这些结果研究了混合价离子掺杂的杂质晶体中本征缺陷的扩散。分析了在高温退火过程中,由于晶界处气氛的氧化还原特性变化而引起的扩散的特殊情况。主要考虑以下基本问题:(i)价态转变的动力学和化学反应区的结构,(ii)确定晶体-大气界面化学反应的类型和分子的类型的可能性扩散缺陷,(iii)反应区中产生的扩张机械应力对反应区结构和扩散过程动力学的影响,以及(iv)确定固有缺陷的扩散参数及其相互作用常数杂质中心。

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