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首页> 外文期刊>Crystallography reports >The Features of Identifying Lines in a Diffraction Image Formed by a Widely Divergent X-Ray Beam
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The Features of Identifying Lines in a Diffraction Image Formed by a Widely Divergent X-Ray Beam

机译:X射线束发散形成的衍射像中的识别线特征

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摘要

A method for identifying lines in a diffraction image formed by a widely divergent X-ray beam and a technique for measuring the crystal structure parameters in the case of asymmetric crystal position have been developed. It is established that, once the distances between a crystal and a photographic plate and between the points of intersection of the hyperbola branches in a diffraction image are known, one can determine the angle between the crystal's zone axis and the wave vector, which leads to multiwave diffraction. Relations linking this angle with the parameters of two atomic planes are obtained. It is found that, to measure the parameters of atomic planes belonging to a given zone, one can use different sets of crossed hyperbolas formed by radiations K___ and K___. The measurements and calculations performed for the same sample (Si crystal), mounted symmet_rically and asymmetrically, confirm the reliability of the proposed method.
机译:已经开发了一种用于识别由大范围发散的X射线束形成的衍射图像中的线的方法以及一种用于在晶体位置不对称的情况下测量晶体结构参数的技术。可以确定的是,一旦知道了晶体和照相板之间的距离以及衍射图像中双曲线分支的交点之间的距离,就可以确定晶体的区域轴与波矢之间的角度,从而得出多波衍射。获得将该角度与两个原子平面的参数相关联的关系。发现,要测量属于给定区域的原子平面的参数,可以使用由辐射K___和K___形成的不同组交叉双曲线。对对称和非对称安装的同一样品(硅晶体)进行的测量和计算,证实了所提出方法的可靠性。

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