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Another approach for controlling size and distribution of nanoparticles in coated conductors fabricated by the TFA-MOD method

机译:一种控制由TFA-MOD方法制造的涂层导体中纳米颗粒尺寸和分布的另一种方法

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摘要

A new process, which is conceptually different from that reported so far, was developed for positive and direct control of the size and distribution of BaZrO3 (BZO) nanoparticles acting as the effective magnetic flux pinning centers for coated conductors (CCs) fabricated on buffered metal substrates by the trifluoroacetate-based metal-organic decomposition method. The (Y, Gd) Ba2Cu3O6+delta (YGdBCO) phase crystallization heat-treatment process was applied one time to a multi-layered precursor prepared by repeating the coating/calcination process of the extremely thin layer of a few tens of nanometers. The size of BZO nanoparticles refined with thinning the once coated film thickness (d(once)) even in the same total film thickness of 0.6-0.7 mu m, consequently the critical current density in magnetic-field (J(c)(B)) was increased. A YGdBCO CC fabricated with donce of 30 nm revealed very high J(c)(B||c) characteristics of 0.26 and 1.60 MA cm(-2) at 77 and 65 K, respectively, for 3.0 T.
机译:到目前为止,概念性地不同的新过程是开发的,用于对Bazro3(BZO)纳米粒子的尺寸和分布作用为在缓冲金属上制造的涂覆导体(CCS)的有效磁通钉钉扎中心的典型和直接控制 由三氟乙酸酯的金属 - 有机分解方法基材。 将(Y,Gd)Ba2Cu3O6 + Delta(YGDBCO)相结晶热处理方法一次应用于通过重复几十纳米的极薄层的涂层/煅烧过程制备的多层前体。 通过薄涂覆一旦涂覆的膜厚度(D(一次))而精制的BZO纳米颗粒的尺寸即使在0.6-0.7μmm的总膜厚度相同,因此磁场中的临界电流密度(j(c)(b) )增加了。 用30nm的荷载制造的ygdbco cc显示出在77和65 k处的0.26和1.60mA(-2)的非常高的j(c)(b || c)特性为3.0 t。

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