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Theoretical Approach to Energy Resolution of Semiconductor Detectors

机译:半导体检测器能量分辨的理论方法

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摘要

All processes occurring in semiconductor detectors during detection of primary monoenergetic particles lead to broadening of spectral lines. In this work, a general expression for the energy resolution of semiconductor detectors is obtained using the theory of branching cascade processes. It is shown that the general formula involves all contributions to the spectral line broadening described in the literature and additional contributions associated with fluctuations of electron and hole lifetimes caused by inhomogeneity of traps in the semiconductor material and fluctuations of the electronic channel gain.
机译:在检测初级单体颗粒期间半导体检测器中发生的所有过程导致光谱线的扩展。 在这项工作中,使用分支级联工艺理论获得半导体检测器的能量分辨率的一般表达。 结果表明,通式涉及对文献中描述的频谱线宽的所有贡献以及与由陷阱中的陷阱中的疏松性引起的电子和孔寿命的波动相关联的额外贡献以及电子通道增益的波动。

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