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首页> 外文期刊>Plasma Science & Technology >Development of a radiographic method for measuring the discrete spectrum of the electron beam from a plasma focus device
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Development of a radiographic method for measuring the discrete spectrum of the electron beam from a plasma focus device

机译：用于测量用于测量来自等离子聚焦装置的电子束的离散谱的放射线照相方法

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摘要

An indirect method is proposed for measuring the relative energy spectrum of the pulsed electron beam of a plasma focus device. The Bremsstrahlung x-ray, generated by the collision of electrons against the anode surface, was measured behind lead filters with various thicknesses using a radiographic film system. A matrix equation was considered in order to explain the relation between the x-ray dose and the spectral amplitudes of the electron beam. The electron spectrum of the device was measured at 0.6 mbar argon and 22 kV charging voltage, in four discrete energy intervals extending up to 500 keV. The results of the experiments show that most of the electrons are emitted in the 125-375 keV energy range and the spectral amplitude becomes negligible beyond 375 keV.
机译：建议采用间接方法测量等离子体聚焦装置的脉冲电子束的相对能谱。 由电子对阳极表面的碰撞产生的Bremsstrahlung X射线被用射线照相膜系统的各种厚度的铅滤波器测量。 考虑了矩阵方程以解释电子束的X射线剂量和谱幅度之间的关系。 在0.6毫巴氩气和22kV充电电压下测量装置的电子光谱，四个离散的能量间隔延伸到500keV。 实验结果表明，大多数电子在125-375keV能量范围内发射，并且光谱幅度超出375keV可忽略不计。

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