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首页> 外文期刊>Technical physics letters: Letters to the Russian journal of applied physics >Studying the Composition and Phase State of Thin PZT Films Obtained by High-Frequency Magnetron Sputtering under Variation of Working Gas Pressure
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Studying the Composition and Phase State of Thin PZT Films Obtained by High-Frequency Magnetron Sputtering under Variation of Working Gas Pressure

机译:在工作气体压力变化下的高频磁控溅射获得的薄PZT薄膜的组成和相位状态

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Variation of the working gas pressure (from 8 to 2 Pa) during RF magnetron sputtering deposition of thin perovskite lead zirconate titanate (PZT) films revealed strong changes in their lead content, which decreased below the stoichiometric level and led to the formation of a two-phase (perovskite-pyrochlore) structure upon subsequent high-temperature annealing. Measurements of the composition of perovskite islands in the two-phase films showed that the lead content in these islands was equal to or greater than stoichiometric. These results lead to the conclusion that the obtained PZT films are free of lead vacancies.
机译:在薄钙钛矿锆型钛酸钛酸盐(PZT)膜的RF磁控溅射沉积期间的工作气体压力(从8至2 PA)揭示其铅含量的强烈变化,降低了化学计量水平,并导致形成两种 - 在随后的高温退火时 - 相位(钙钛矿 - 纤维)结构。 两相膜中Perovskite岛的组成的测量表明,这些岛中的铅含量等于或大于化学计量。 这些结果导致所获得的PZT薄膜没有引线空位。

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