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Doubly excited states of molecular nitrogen by scattered electron-ion coincidence measurements

机译:通过散射电子离子重合测量逐渐激发分子氮的状态

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Scattered electron-ion coincidence measurements were performed on molecular nitrogen (N-2) to study the relaxation dynamics of doubly excited states. Doubly excited states are typically so unstable that they result in either auto-ionization or a neutral dissociation. In auto-ionization, ionization and dissociation typically occur. Using a mixed-gas method, we determined the absolute values of the generalized oscillator strength (GOS) distributions using an incident electron energy of 200 eV and a scattering angle of 6A degrees. The GOS distributions of N-2 (+) and N+ were determined by combining the coincidence ion signals, which revealed some doubly excited states of N-2. Since electron impact experiments can provide information on optically forbidden transitions, the contribution of optically forbidden states appears in the GOS distributions of both N-2 (+) and N+. We observed auto-ionization and dissociative auto-ionization induced by excitation to the optically forbidden doubly excited states in the range of 30-40 eV.
机译:对分子氮(N-2)进行散射电子离子重合测量,以研究双重激发态的松弛动力学。双重激发状态通常如此不稳定,使得它们导致自动电离或中性解离。在自动电离中,通常发生电离和解离。使用混合气体方法,使用200eV的入射电子能量和6A度的散射角度确定广义振荡器强度(GOS)分布的绝对值。通过组合重合离子信号来确定N-2(+)和N +的GOS分布,该磁依赖性离子信号揭示了N-2的一些双重激发状态。由于电子冲击实验可以提供有关光学禁止的转换的信息,因此光学禁止状态的贡献出现在N-2(+)和N +的GOS分布中。我们观察到通过激发到光学禁止的双重激发状态的自动电离和分离的自动电离在30-40eV的范围内。

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