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Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems

机译:电力噪声延迟建模和数字系统的温度感知设计和测试

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The implementation of complex, high-performance functionalities in low-power nano-CMOS technologies faces significant design and test challenges related to the increased susceptibility to environmental or operation-dependent disturbances, process variations or emerging defect types. This paper describes the application of semi-empirical propagation delay variation models to support the design and test of low-power nanometer digital circuits, taking into account these challenging issues. Results are presented demonstrating that the models provide designers and test engineers with a powerful tool to analytically account for all effects leading to delay faults. They can be used to define parametric delay tests, as well as to design circuits with increased robustness to delay faults under low-power operation. Its derivation and application can be easily automated, allowing them to be integrated in standard flows.
机译:低功耗纳米CMOS技术的复杂高性能函数的实施面临着显着的设计和测试挑战,与对环境或操作依赖性干扰,过程变化或新出现的缺陷类型的易感性增加。 本文介绍了半经验传播延迟变化模型的应用,支持低功率纳米数字电路的设计和测试,考虑到这些挑战性问题。 提出了结果表明,该模型为设计师和测试工程师提供了强大的工具,用于分析导致延迟故障的所有效果。 它们可用于定义参数延迟测试,以及设计电路,以增加鲁棒性以在低功率操作下延迟故障。 它的推导和应用可以很容易地自动化,允许它们集成在标准流中。

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