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首页> 外文期刊>Journal of Low Power Electronics >EX-DRIVE: An Execution Driven Functional Verification Flow
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EX-DRIVE: An Execution Driven Functional Verification Flow

机译：EX-DRIVE：执行驱动的功能验证流程

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摘要

In EDA industry, design-under-test (DUT) is a pre-silicon digital design which is still undergoing testing phase. We perform functional-verification of a DUT to verify whether the DUT conforms to the specifications. Functional verification has been pre-dominantly performed through simulation of a DUT. However, their execution speed rapidly degrades when DUT size reaches 100 million gates. This increase in design complexity then results in almost doubling the verification effort. The increasing design and verification space bring about the need for random dynamic simulation, using which only the typical behaviors, and not all possible behaviors of a chip, can be verified in a time bound simulation run. To overcome this bottleneck, the EDA industry is increasingly adopting "hardware-accelerated simulation platforms," which are classified as simulation-accelerators, emulators and FPGA prototypes. These still does not address the state-space problem effectively as all these platforms still work in the cycle-driven or event-driven mode and calls for a huge design porting effort to the native development environment. The need of the hour is a simulator that needs to be design-aware enough to partition and map huge data-flow graphs (DFGs) of scientific applications at each abstraction level of verification and schedule it for simulation. In this paper, we present a novel approach for dynamic pre-silicon verification, called EXDRIVE (execution-driven functional verification methodology). It addresses the state-space explosion problem in verification by hosting a variety of partitioning and mapping algorithms. We show that the proposed functional-verification flow achieves significant improvement in verification performance over industry standard simulators and emulation platforms.
机译：在EDA行业中，设计欠款（DUT）是一种静态的数字设计，仍在进行测试阶段。我们执行DUT的功能验证，以验证DUT是否符合规范。通过模拟DUT进行功能验证已经预先占主导地位。然而，当DUT尺寸达到1亿盖茨时，他们的执行速度迅速降低。这种设计复杂性的增加导致验证工作几乎加倍。越来越多的设计和验证空间带来了随机动态仿真的需要，使用哪些典型的行为，而不是芯片的所有可能的行为，可以在绑定的模拟运行中验证。为了克服这一瓶颈，EDA行业越来越多地采用“硬件加速的仿真平台”，该平台被分类为仿真 - 加速器，仿真器和FPGA原型。这些仍然没有有效地解决了国家空间问题，因为所有这些平台仍然在循环驱动或事件驱动模式下工作，并呼吁对本机开发环境进行巨大的设计移植工作。小时的需要是一种模拟器，需要设计，以便在每个抽象验证水平的验证水平下分区和映射科学应用程序的巨大数据流图（DFGS）并将其调度。在本文中，我们提出了一种新的动态预硅验证方法，称为EXDrive（执行驱动的功能验证方法）。它通过托管各种分区和映射算法来验证状态空间爆炸问题。我们表明，拟议的功能验证流程验证对行业标准模拟器和仿真平台的验证性能的显着提高。

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