首页> 外文期刊>Journal of Materials Engineering and Performance >Synthesis and Characterization of Silicon Nanowires by Electroless Etching
【24h】

Synthesis and Characterization of Silicon Nanowires by Electroless Etching

机译:无电蚀刻硅纳米线的合成与表征

获取原文
获取原文并翻译 | 示例
           

摘要

Silicon nanowires (SiNWs) were synthesized by two-step electroless etching of p -type Si (100) wafer and characterized by field emission scanning electron microscopy, UV–Vis spectroscopy, x-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy and Raman spectroscopy. The vibrational signature at 1108 and 2087?cm_(?1)confirmed SiNWs were passivated by both oxygen and hydrogen atoms. Raman peak at 517?cm_(?1)indicated crystalline SiNWs with tailing toward redshift due to Fano effect. The Si(2 p ) and Si(2 s ) core orbital spectra of SiNWs were found at 99.8 and 150.5?eV, respectively. Moreover, the reflection of SiNWs is minimized to?~?1 to 5% in the 650-nm wavelength.
机译:通过P-TYPE Si(100)晶片的两步无电蚀刻合成硅纳米线(SINW),其特征在于通过现场发射扫描电子显微镜,UV-Vis光谱,X射线光电子能谱,傅里叶变换红外光谱和拉曼光谱。 在1108和2087的振动签名在1108和2087?cm _(α1)确认的sinws被氧气和氢原子钝化。 拉曼峰在517?cm _(α1)指示由于Fano效应而导致拖曳的晶体Sinws。 SINWS的Si(2 p)和Si(2 s)核心轨道光谱分别在99.8和150.5?EV中发现。 此外,SINWS的反射最小化到650nm波长中的〜Δ1至5%。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号