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首页> 外文期刊>Journal of Quality Technology >Yield-based process capability indices for nonnormal continuous data
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Yield-based process capability indices for nonnormal continuous data

机译:非正规连续数据的基于产量的过程能力指标

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摘要

Process capability indices (PCIs) are widely used to assess whether an in-control process meets manufacturing specifications. In most applications of classical PCIs, the process characteristic is assumed normally distributed. However, the normal distribution has been found inappropriate in various applications. In the literature, the percentile-based PCIs are widely used to deal with the nonnormal process. One problem associated with the percentile-based PCIs is that they do not provide a quantitative interpretation to the process capability. In this study, new PCIs that have a consistent quantification to the process capability for both normal and non-normal processes are proposed. The proposed PCIs are generalizations of the classical normal PCIs in the sense that they are the same as the classical PCIs when the process characteristic follows a normal distribution, and they offer the same interpretation to the process capability as the classical PCIs when the process characteristic is nonnormal. We then discuss nonparametric and parametric estimation of the proposed PCIs. The nonparametric estimator is based on the kernel density estimation and confidence limits are obtained by the nonparametric bootstrap, while the parametric estimator is based on the maximum likelihood estimation and confidence limits are constructed by the method of generalized pivots. The proposed methodologies are demonstrated using a real example from a manufacturing factory.
机译:过程能力指数(PCIS)广泛用于评估控制过程是否符合制造规范。在大多数经典PCI的应用中,假设通常分布过程特性。但是,在各种应用中发现了正常分布不合适。在文献中,基于百分位的PCI被广泛用于处理非正规过程。与基于百分位的PCI相关的一个问题是它们不提供对过程能力的定量解释。在本研究中,提出了对正常和非正常过程的过程能力一致定量的新PCI。所提出的PCI是经典普通PCI的概括,因为当过程特征遵循正常分布时它们与经典PCI相同,并且它们为当过程特征时的经典PCI具有与过程能力相同的解释非常规。然后,我们讨论所提出的PCI的非参数和参数估计。非参数估计器基于内核密度估计,并且通过非参数自由释放获得置信限制,而参数估计器基于最大似然估计,并且通过广义枢轴的方法构建置信限制。所提出的方法是使用来自制造厂的真实例子来证明。

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