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首页> 外文期刊>Journal of Quality Technology >Constructing Tolerance Intervals for the Number of Defectives Using Both High-and Low-Resolution Data
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Constructing Tolerance Intervals for the Number of Defectives Using Both High-and Low-Resolution Data

机译：使用高和低分辨率数据构造缺陷数量的公差间隔

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摘要

Defect inspection is important in many industries, such as in the manufacturing and pharmaceutical industries. Existing methods usually use either low-resolution data, which are obtained from less precise measurements, or high-resolution data, which are obtained from more precise measurements, to estimate the number of defectives in a given amount of goods produced. In this study, a novel approach is proposed that combines the two types of data to construct tolerance intervals with a desired average coverage probability. A simulation study shows that the derived tolerance intervals can lead to better performance than a tolerance interval that is constructed based on only the low-resolution data. In addition, a real-data example shows that the tolerance interval based on only the low-resolution data is more conservative than the tolerance intervals based on both high-resolution and low-resolution data.
机译：缺陷检查在许多行业中是重要的，例如制造和制药行业。 现有方法通常使用从更精确的测量值获得的低分辨率数据，或从更精确的测量获得的高分辨率数据，以估计产生的给定金额的缺陷数量。 在该研究中，提出了一种新的方法，其组合了两种类型的数据来构造具有期望的平均覆盖概率的公差间隔。 仿真研究表明，推出的公差间隔可以导致比仅基于低分辨率数据构造的公差间隔更好的性能。 另外，实际数据示例表明，基于低分辨率数据的公差间隔比基于高分辨率和低分辨率数据的公差间隔更保守。

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