Avalanche breakdown in silicon devices for contactless logic testing and optical interconnect

Selahattin Sayil

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Avalanche breakdown in silicon devices for contactless logic testing and optical interconnect

机译：用于非接触式逻辑测试和光互连的硅器件中的雪崩击穿

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A silicon p-n junction that is biased in avalanche breakdown mode emits visible light. Although the efficiency of such silicon emitters is poor, their ability to modulate at GHz frequencies make them a good choice for many applications including optical interconnect and optical contactless logic testing. Results demonstrate the feasibility of an all silicon optical interconnect system and an all silicon contactless testing methodology using the silicon light emitter and standard silicon detectors. The development of truly efficient silicon light emitting would enable many new applications.

机译：以雪崩击穿模式偏置的硅p-n结发射可见光。尽管这种硅发射器的效率很差，但它们在GHz频率下进行调制的能力使其成为许多应用（包括光学互连和光学非接触逻辑测试）的不错选择。结果证明了使用硅光发射器和标准硅探测器的全硅光学互连系统和全硅非接触式测试方法的可行性。真正有效的硅发光技术的发展将使许多新应用成为可能。

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《Analog Integrated Circuits and Signal Processing》 |2008年第3期|共9页
作者
Selahattin Sayil;
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原文格式 PDF
正文语种 eng
中图分类半导体集成电路（固体电路）;
关键词
Silicon photonics; Avalanche breakdown; All-silicon; Optical interconnect; Optical testing;

机译：硅光子学;雪崩击穿;全硅;光学互连;光学测试;

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专利

1. Avalanche breakdown in silicon devices for contactless logic testing and optical interconnect [J] . Selahattin Sayil Analog Integrated Circuits and Signal Processing . 2008,第3期

机译：用于非接触式逻辑测试和光互连的硅器件中的雪崩击穿
2. Chip-scale optical interconnects and optical data processing using silicon photonic devices [J] . Wang Jian Photonic network communications . 2016,第2期

机译：使用硅光子器件的芯片级光学互连和光学数据处理
3. Lightwave Logic's Organic Polymer Thermal Aging Testing Indicates Decades of Operational Performance Company Initiates Benchmark Testing on Organic Polymer Coated Chips Versus Silicon Photonic Devices [J] . Hui Pan Fiber Optic Sensors & Systems . 2015,第1期

机译：Lightwave Logic的有机聚合物热老化测试表明数十年的运营绩效公司针对有机聚合物涂层芯片和硅光子器件启动了基准测试
4. On the Use of Silicon Photonics for Optical Interconnect and Contactless Logic Testing [C] . Selahattin Sayil IEEE Region 5 Technical Conference . 2007

机译：关于光学互连和非接触式逻辑试验的硅光子仪的应用
5. All-silicon optical contactless testing of integrated circuits. [D] . Sayil, Selahattin. 2000

机译：集成电路的全硅光学非接触式测试。
6. On-chip wireless silicon photonics: from reconfigurable interconnects to lab-on-chip devices [O] . Carlos García-Meca, Sergio Lechago, Antoine Brimont, 2017

机译：片上无线硅光子学：从可重新配置的互连到片上实验室设备
7. Deposited Silicon Photonics: Optical Interconnect Devices In Polycrystalline Silicon [O] . Preston Kyle 2011

机译：沉积硅光子学：多晶硅中的光学互连器件
8. Integration of picosecond GaAs photoconductive devices with silicon circuits for optical clocking and interconnects. [R] . Morse, J., Mariella, R. P., Anderson, G., 1990

机译：将皮秒Gaas光电导器件与硅电路集成，用于光学时钟和互连。

Avalanche breakdown in silicon devices for contactless logic testing and optical interconnect

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