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Growth of Tetragonal Si via Plasma-Enhanced Epitaxy

机译:通过等离子体增强外延的四方Si生长

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摘要

We have been able to synthesize directly the tetragonal Si by low temperature plasma-enhanced chemical vapor deposition using hydrogen and silane as the precursor and carrier gas, respectively. With the optimization of growth conditions, a stable tetragonal epitaxial Si can be grown on a crystalline Si substrate at large scale. By combining X-ray diffraction and high resolution transmission electron microscopy measurements, we found that the epitaxial layer has smaller in-plane but larger out-of-plane lattice parameters as compared to the crystalline substrate. The existence of hydrogen platelets in epitaxy is also observed, which affects the diffraction patterns along that direction. We attribute the formation of tetragonal Si to the hydrogenated-cluster-assisted epitaxy. Other possible reasons including host sites of hydrogen atoms and thermal expansion coefficients are also discussed.
机译:我们能够通过使用氢气和硅烷作为前体和载气的低温等离子体增强的化学气相沉积来直接通过低温等离子体增强的化学气相沉积来合成四边形Si。 随着生长条件的优化,可以在大规模的结晶Si衬底上生长稳定的四方外延Si。 通过组合X射线衍射和高分辨率透射电子显微镜测量,我们发现与晶体基板相比,外延层具有较小的平面内但是更大的外平面晶格参数。 还观察到外延的氢血小板存在,这沿着该方向影响衍射图案。 我们将四边形Si的形成归因于氢化聚类辅助外延。 还讨论了包括霍尔原子和热膨胀系数的宿主部位的其他可能的原因。

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  • 来源
    《Crystal growth & design》 |2017年第8期|共5页
  • 作者单位

    Univ Paris Saclay CNRS Ecole Polytech LPICM F-91128 Palaiseau France;

    Univ Paris Saclay CNRS Ecole Polytech LPICM F-91128 Palaiseau France;

    Univ Paris Saclay CNRS Ecole Polytech LPICM F-91128 Palaiseau France;

    Univ Paris Saclay CNRS Ecole Polytech LPICM F-91128 Palaiseau France;

    Univ Paris Sud Univ Paris Saclay CNRS C2N F-91460 Marcoussis France;

    Univ Paris Saclay CNRS Ecole Polytech LPICM F-91128 Palaiseau France;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 晶体学;
  • 关键词

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