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Nanoscale Domain Imaging of All-Polymer Organic Solar Cells by Photo-Induced Force Microscopy

机译：全聚合物有机太阳能电池的纳米级域成像通过光诱导力显微镜

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摘要

Rapid nanoscale imaging of the bulk heterojunction layer in organic solar cells is essential to the continued development of high-performance devices. Unfortunately, commonly used imaging techniques such as tunneling electron microscopy (TEM) and atomic force microscopy (AFM) suffer from significant drawbacks. For instance, assuming domain identity from phase contrast or topographical features can lead to inaccurate morphological conclusions. Here we demonstrate a technique known as photo-induced force microscopy (PiFM) for imaging organic solar cell bulk heterojunctions with nanoscale chemical specificity. PiFM is a relatively recent scanning probe microscopy technique that combines an AFM tip with a tunable infrared laser to induce a dipole for chemical imaging. Coupling the nanometer resolution of AFM with the chemical specificity of a tuned IR laser, we are able to spatially map the donor and acceptor domains in a model all-polymer bulk heterojunction with resolution approaching 10 nm. Domain size from PiFM images is compared to bulk-averaged results from resonant soft X-ray scattering, indicating excellent quantitative agreement. Further, we demonstrate that in our all-polymer system, the AFM topography, AFM phase, and PiFM show poor correlation, highlighting the need to move beyond standard AFM for morphology characterization of bulk heterojunctions.
机译：在有机太阳能电池中散装异质结层的快速纳米级成像对高性能设备的持续发展至关重要。遗憾的是，常用的成像技术，例如隧穿电子显微镜（TEM）和原子力显微镜（AFM）遭受显着的缺点。例如，假设来自相位对比度或地形特征的域标识可能导致不准确的形态结论。在这里，我们证明了一种称为光诱导力显微镜（PIFM）的技术，用于以纳米级化学特异性成像有机太阳能电池杂交异质。 PIFM是一种相对近期的扫描探针技术，将AFM尖端与可调谐红外激光器结合以诱导偶极化学成像。将AFM的纳米分辨率与调谐IR激光器的化学特异性耦合，我们能够在型号全聚合物本体异质结中空间地映射施主和受体域，分辨率接近10nm。将PIFM图像的域大小与谐振软X射线散射的批量平均结果进行比较，表明出色的定量协议。此外，我们证明，在我们的全聚合物系统中，AFM地形，AFM阶段和PIFM表现出不良相关性，突出了移动超越标准AFM的需要，以进行散装异质结的形态表征。

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