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首页> 外文期刊>Applied radiation and isotopes: including data, instrumentation and methods for use in agriculture, industry and medicine >Angular and impact energy dependence of intensity ratio of K-alpha,K-beta x-rays to underneath bremsstrahlung radiation emitted from 15 to 25 keV electrons incident on a pure thick Cu (Z=29) target
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Angular and impact energy dependence of intensity ratio of K-alpha,K-beta x-rays to underneath bremsstrahlung radiation emitted from 15 to 25 keV electrons incident on a pure thick Cu (Z=29) target

机译：k-α，k-beta X射线的强度比的角度和冲击能量依赖于15至25keV电子入射在纯浓稠的Cu（Z = 29）靶上发射的Bremsstrahlung辐射的辐射

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摘要

We present new results on angular and impact energy dependence of the relative intensity ratios of K-alpha and K-beta characteristic (CS) x-ray lines to their respective underneath bremsstrahlung (BS) radiation produced from 15-25 keV electrons incident on a thick polycrystalline pure target of Cu (Z = 29). The angular distributions of relative intensity ratios were carried out by measuring the radiations emitted at incidence angle theta(i) that varied from 15 degrees to 75 degrees in reflection geometry mode of the target. The x-rays emerging from the target surface were detected by an energy dispersive Si PIN photodiode detector. The magnitude of relative intensity ratio of K-alpha/BS is found to be larger than that of K-beta/BS by a factor of about 5.11, 5.24 and 5.49 for 15 keV, 20 keV and 25 keV impact energy, respectively measured, for example, at theta(i) = 15 degrees. However, the intensity ratio of a given characteristic line to its underneath BS increases on average by a factor of about 2.2 in varying the impact energy from 15 keV to 25 keV measured at different angles. The experimental results on angular and impact energy dependence are compared with the corresponding results obtained from Monte-Carlo simulations using the PENELOPE code. The overall agreement between experiment and theory is found to be satisfactory within the uncertainty of measurements.
机译：我们在k-α和k-beta特征（Cs）X射线线的相对强度比的角度和冲击能量依赖性的新结果，从15-25keV电子事件产生的辐射（BS）辐射的相应辐射Cu（Z = 29）的厚多晶纯靶。通过测量在靶的反射几何模式下在15度到75度下变化的入射角θ（i）发射的辐射来进行相对强度比的角分布。通过能量分散的Si PIN光电二极管检测器检测从目标表面渗出的X射线。发现K-α/ BS的相对强度比的幅度大于k-β/ bs的大约5.11,5.24和5.49的k-beta / bs，分别测量，例如，在Theta（i）= 15度。然而，在BS下方BS下方的给定特征线的强度比在不同角度下改变15keV至25keV的冲击能量，平均增加约2.2的因子。将角度和冲击能量依赖的实验结果与使用Penelope码从Monte-Carlo模拟获得的相应结果进行比较。在测量的不确定性内，发现实验与理论之间的总体协议令人满意。

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