首页> 外文期刊>Electronic Device Failure Analysis: A Resource for Technical Information and Industry Developments >FAILURE ANALYSIS, STATISTICAL RISK ASSESSMENT, AND ADVANCED MODELING IN A STRUCTURED PROBLEM SOLVING APPROACH: CASE STUDY FOR A DELAMINATION DEFECT IN THE AUTOMOTIVE SEMICONDUCTOR INDUSTRY
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FAILURE ANALYSIS, STATISTICAL RISK ASSESSMENT, AND ADVANCED MODELING IN A STRUCTURED PROBLEM SOLVING APPROACH: CASE STUDY FOR A DELAMINATION DEFECT IN THE AUTOMOTIVE SEMICONDUCTOR INDUSTRY

机译:故障分析,统计风险评估和结构化解决方法的先进建模:汽车半导体工业中分层缺陷的案例研究

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摘要

INTRODUCTION: No matter the industrial context, a failure analysis has to study and present only facts, and has never to manage assumptions. Performing some assumptions about failure root causes goes beyond failure analysis, and is considered risk assessment, when root causes are studied to predict new potential failures that may be expected later in the field and to prevent reoccurrence, by implementing corrective actions. So, a risk assessment may use assumptions and statistical analysis to validate these assumptions.
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