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Beam characterization by means of emission spectroscopy in the ELISE test facility

机译：ELISE测试设施中发射光谱法的光束特征

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The ELISE (extraction from a large ion source experiment) test facility at IPP Garching hosts a RF H- / D(-)ion source and an acceleration system. Its target is to demonstrate the performance foreseen for the ITER neutral beam injector (NBI) system in terms of extracted current density (H / D), fraction of co-extracted electrons and pulse duration. The size of the ELISE extraction area is half that foreseen for the ITER NBI. This paper presents a detailed study of the ELISE beam divergence and uniformity. In particular, it was possible to describe the beam as the sum of two components at very different divergence: about 2 degrees versus 5 degrees/ 7 degrees. As test cases, the beam properties have been measured as function of two source parameters. The first one is the current flowing through the grid facing the plasma, the plasma grid (PG), in order to generate the magnetic filter field. The second one is the bias current flowing between the PG and the source walls. Both the filter field and the bias current influence the fraction of co-extracted electrons, but also the properties of the plasma just in front of the extraction system and the beam properties. The divergence and the uniformity of the beam have been measured by a beam emission spectroscopy (BES) diagnostic; the detailed analysis of the raw spectra collected by BES led to describing the beam with two components of different divergence. This concept has been supported by the information given by thermal imaging of the diagnostic calorimeter. Further support to the proposed beam model has been found in the behavior of the currents flowing in the acceleration system and beamline components; these currents are given by the most divergent (charged) particles of the beam.
机译：IPP Garching的ELISE（从大型离子源实验中提取）测试设施拥有一个RF H-/D（-）离子源和一个加速系统。其目标是展示ITER中性束注入器（NBI）系统在提取电流密度（H/D）、共提取电子分数和脉冲持续时间方面的预期性能。ELISE提取区域的大小是ITER NBI预计的一半。本文详细研究了ELISE光束的发散和均匀性。特别是，可以将光束描述为两个不同发散度的分量之和：大约2度与5度/7度。作为测试案例，束流特性作为两个源参数的函数进行了测量。第一个是电流流过面对等离子体的栅极，即等离子体栅极（PG），以产生磁过滤场。第二个是在PG和源壁之间流动的偏置电流。滤光片场和偏置电流都会影响共萃取电子的比例，但也会影响萃取系统前面的等离子体的特性和束流特性。用束发射光谱（BES）诊断仪测量了光束的发散度和均匀性；通过对BES收集的原始光谱的详细分析，可以描述具有不同发散度的两个分量的光束。这一概念得到了诊断热量计热成像所提供信息的支持。在加速系统和波束线组件中流动的电流行为中发现了对所提出波束模型的进一步支持；这些电流是由光束中最发散（带电）的粒子产生的。

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