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Variability in quartz OSL signals caused by measurement uncertainties: Problems and solutions

机译：测量不确定性引起的石英OSL信号中的可变性：问题和解决方案

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We simulated the variability in measured quartz optically stimulated luminescence (OSL) signals and dose response curves (DRCs) caused by measurement uncertainties, including counting statistics and instrumental irreproducibility. We find that these measurement errors can give rise to large variations in the observed luminescence signal and contribute to among-aliquot or among-grain scatter in DRCs and equivalent dose (D-e) values. Different measurement systems (i.e., luminescence readers) may have different counting statistics properties and, hence, may exhibit differing extents of variation in the observed OSL signal, even for the same sample. Our simulation shows that the random measurement uncertainties may result in some grains or aliquots being 'saturated' (that is, the measured natural signal is consistent with, or lies above, the saturation level of the measured DRC) and that the rejection of these 'saturated' grains may result in a truncated D-e distribution, with D-e underestimation for samples with natural doses close to saturation (e.g., twice the characteristic saturation dose, D-0). We propose a new method to deal with this underestimation problem, in which standardised growth curves (SGCs) are established and the weighted-mean natural signal (L-n/T-n) from all measured grains is projected on to the corresponding SGCs to determine D-e. Our simulation results show that this method can produce reliable D-e estimates up to 5D(0), which is far beyond the conventional limit of similar to 2D(0) using the standard SAR procedure. (C) 2017 Elsevier B.V. All rights reserved.
机译：我们模拟了由测量不确定性（包括计数统计和仪器不可再现性）引起的测量石英光激发光（OSL）信号和剂量响应曲线（DRC）的变化。我们发现，这些测量误差会导致观察到的发光信号发生较大变化，并导致DRC中的小份或颗粒间散射和等效剂量（D-e）值。不同的测量系统（即发光阅读器）可能具有不同的计数统计特性，因此，即使对于同一样品，观测到的OSL信号也可能表现出不同程度的变化。我们的模拟表明，随机测量的不确定性可能会导致一些颗粒或小份颗粒“饱和”（即，测量的自然信号与测量的DRC的饱和水平一致，或高于该饱和水平），并且拒绝这些“饱和”颗粒可能会导致截断的D-e分布，对于自然剂量接近饱和（例如，两倍于特征饱和剂量，D-0）的样品，D-e低估。我们提出了一种处理这种低估问题的新方法，即建立标准化生长曲线（SGC），并将所有测量晶粒的加权平均自然信号（L-n/T-n）投影到相应的SGC上，以确定D-e。我们的模拟结果表明，该方法可以产生高达5D（0）的可靠D-e估计，这远远超出了使用标准SAR程序时与2D（0）类似的常规限制。（C） 2017爱思唯尔B.V.版权所有。

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