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On X-ray back-scattering to detect hidden cracks in multi-layer structures

机译:通过X射线反向散射检测多层结构中的隐藏裂缝

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摘要

A method that uses X-ray scanning to detect subsurface cracks is described. The method deals with samples typical of aircraft structures for which access is limited to one surface and a crack is hidden within the first substrate layer beneath the surface layer. A single-scatter model for the total response due to all X-rays that scatter once in one of the substrate layers and then pass through the top surface of the crack region and escape the target is developed. In this model, the crack is treated as a region of lower average density, and hence interaction coefficient, than the unaffected bulk material. The EGS4 Monte Carlo code also is used to estimate multiple-scattering response assuming the crack region is a thin void. These two models provide consistent results which indicate that properly designed X-ray back-scatter scanners can identify the presence of hidden cracks that extend through the substrate layer and are greater than about I cm in length. (c) 2006 Elsevier Ltd. All rights reserved.
机译:描述了一种使用X射线扫描来检测地下裂缝的方法。该方法处理典型的飞机结构的样品,对于这些样品,其进入被限制在一个表面上,并且在表面层下面的第一基底层内隐藏了裂缝。针对所有X射线在基材层之一中散射一次,然后穿过裂纹区域的顶面并逃离目标的总X射线,建立了总响应的单散射模型。在此模型中,将裂纹视为比未受影响的散装材料平均密度低,因此具有较低的相互作用系数的区域。假设裂纹区域是稀薄的空隙,则EGS4蒙特卡洛代码也可用于估算多重散射响应。这两个模型提供了一致的结果,表明正确设计的X射线反向散射扫描仪可以识别出存在的裂纹的存在,这些裂纹延伸穿过基板层并且长度大于大约1厘米。 (c)2006 Elsevier Ltd.保留所有权利。

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