Statistical analysis of low-level material screening measurements via gamma-spectroscopy.

Heisel M; Kaether F; Simgen H

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Statistical analysis of low-level material screening measurements via gamma-spectroscopy.

机译：通过伽马光谱法对低水平物质筛选测量值进行统计分析。

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Background estimations in neutrinoless double beta decay experiments (0nubetabeta) require reliable statistical limits on gamma-spectrometric low-level material screening measurements. For this purpose a custom method based on Bayesian statistics with reference to the international standard ISO 11929-7 is presented. The analysis combines the data from sample- and background spectra and comprises the physical knowledge of non-negative counting rates. It allows to incorporate multiple gamma lines of radionuclides. The confidence intervals pass continuously from two-sided intervals into single-sided upper limits.

机译：中微子双β衰变实验（0nubeta）的背景估计需要对伽玛光谱低水平物质筛选测量值具有可靠的统计限制。为此，提出了一种基于贝叶斯统计的自定义方法，并参考了国际标准ISO 11929-7。该分析结合了来自样品和背景光谱的数据，并且包含了非负计数率的物理知识。它允许并入多条放射性核素的伽马线。置信区间从双面区间连续变为单面上限。

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《Applied radiation and isotopes: including data, instrumentation and methods for use in agriculture, industry and medicine》 |2009年第5期|共5页
作者
Heisel M; Kaether F; Simgen H;
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正文语种 eng
中图分类原子核物理学、高能物理学;放射医学;
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1. Statistical analysis of low-level material screening measurements via gamma-spectroscopy. [J] . Heisel M, Kaether F, Simgen H Applied radiation and isotopes: including data, instrumentation and methods for use in agriculture, industry and medicine . 2009,第5期

机译：通过伽马光谱法对低水平物质筛选测量值进行统计分析。
2. Screening of Monoclonal Antibody Formulations Based on High-Throughput Thermostability and Viscosity Measurements: Design of Experiment and Statistical Analysis [J] . FENG HE, CHRISTOPHER E. WOODS, EGOR TR1LISKY, Journal of pharmaceutical sciences. . 2011,第4期

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3. Statistical Analysis of a Round-Robin Measurement Survey of Two Candidate Materials for a Seebeck Coefficient Standard Reference Material [J] . Z. Q. J. Lu, N. D. Lowhorn, W. Wong-Ng, Journal of Research of the National Institute of Standards and Technology . 2009,第1期

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4. A New Measurement Technique of Low-Level Strain Retardation in Optoelectronic Materials [C] . Kenji Gomi, Yasushi Niitsu, Kensuke Ichinose Electronic Systemintegration Technology Conference . 2006

机译：光电材料低水平应变延迟的新测量技术
5. Analysis of non-crystalline materials with optical measurements by dispersion analysis. [D] . MacDonald, Steven Andrew. 2000

机译：通过色散分析通过光学测量分析非晶态材料。
6. Statistical Analysis of a Round-Robin Measurement Survey of Two Candidate Materials for a Seebeck Coefficient Standard Reference Material [O] . Z. Q. J. Lu, N. D. Lowhorn, W. Wong-Ng, 2009

机译：Seebeck系数标准参考材料的两种候选材料的轮循测量调查的统计分析
7. Statistical Analysis of a Round-Robin Measurement Survey of Two Candidate Materials for a Seebeck Coefficient Standard Reference Material [O] . Z.Q.J. Lu, N.D. Lowhorn, W. Wong-Ng, 2009

机译：塞贝克系数标准参考材料两种候选材料循环测量调查的统计分析
8. Statistical Analysis of a Round-Robin Measurement Survey of Two Candidate Materials for a Seebeck Coefficient Standard Reference Material [R] . Lu, Z. Q., Lowhorn, N. D., Wong-Ng, W., 2009

机译：塞贝克系数标准参考物质两种候选材料循环测量概述的统计分析

Statistical analysis of low-level material screening measurements via gamma-spectroscopy.

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