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Preparation of optical quality ZnCdTe thin films by vacuum evaporation

机译：真空蒸发制备光学品质的ZnCdTe薄膜

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A procedure to make optical quality thin films of ZnxCd1-xTe by use of vacuum evaporation of the ternary compound has been developed. The starting point was the preparation of the compound that was then used as the source in a simple vacuum evaporation system. The characteristics of a film containing 85% ZnTe (x = 0.85) are presented. Electron microscope, atomic force microscope, x-ray and optical spectral measurements were made. The index of refraction was determined at room temperature from transmittance measurements in the range of from 580 to 800 nn and was found to agree within 1% with values found by others for single crystals. We did this by assuming a Sellmeier equation and a known index of refraction at infinite wavelength. The calculation also yielded the roughness of the film. (C) 1998 Optical Society of America. [References: 19]
机译：已经开发了通过使用三元化合物的真空蒸发来制造ZnxCd1-xTe光学品质薄膜的方法。起点是化合物的制备，然后将其用作简单的真空蒸发系统的来源。呈现了包含85％ZnTe（x = 0.85）的薄膜的特性。进行了电子显微镜，原子力显微镜，X射线和光谱测量。折射率是在室温下从580到800 nn的透射率测量值确定的，发现与其他单晶的值相符1％。为此，我们假设了Sellmeier方程和无限波长下的已知折射率。该计算还产生了膜的粗糙度。 （C）1998年美国眼镜学会。 [参考：19]

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