Analysis of reflectometers for surface anisotropy

Antonio Salvati; Piero Chiaradia

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Analysis of reflectometers for surface anisotropy

机译：反射计的表面各向异性分析

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A succinct analysis of normal-incidence reflectometers for surface anisotropy, based on the Jones-matrix formalism, is performed. In particular, two relevant configurations with and without analyzers are compared and discussed. The latter is found to be more user friendly than the former, since most errors vanish to the first order of approximation. Therefore the optical alignment is greatly simplified. On the other hand, this configuration does not yield complete physical information. We discuss how this drawback can be circumvented in surface studies by use of the three-layer model and a Kramers-Kronig analysis.

机译：基于琼斯矩阵形式主义，对法向入射反射仪的表面各向异性进行了简要分析。特别地，比较和讨论了具有和不具有分析器的两种相关配置。发现后者比前者更加用户友好，因为大多数错误都消失在近似的一阶。因此，极大地简化了光学对准。另一方面，此配置不会产生完整的物理信息。我们讨论了如何通过使用三层模型和Kramers-Kronig分析来在表面研究中规避这一缺陷。

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《Applied optics》 |2000年第31期|共7页
作者
Antonio Salvati; Piero Chiaradia;
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正文语种 eng
中图分类光学;
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机译：反射计的表面各向异性分析
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Analysis of reflectometers for surface anisotropy

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