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Improvement of the interferometric method for measuring electro-optic coefficients of poled polymer thin films

机译:极化聚合物薄膜电光系数干涉测量方法的改进

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摘要

The interferometric method for measuring the linear electro-optic coefficients of polymer films has been improved. This improved method is based on using the antipiezoelectric effect of a quartz crystal to compensate for the change in the optical path length that is due to the electro-optic effect of a polymer film. The electro-optic coefficients of six kinds of new poled polymer film have been determined at a wavelength of 633 nm by this new method. This technique offers a simple, rapid, and highly sensitive method for measuring the electro-optic coefficients of polymer films.
机译:改进了用于测量聚合物膜线性电光系数的干涉法。这种改进的方法是基于利用石英晶体的反压电效应来补偿由于聚合物膜的电光效应而引起的光程长度变化。通过这种新方法,已经确定了六种新型极化聚合物薄膜在633 nm波长下的电光系数。该技术提供了一种简单,快速且高度灵敏的方法来测量聚合物薄膜的电光系数。

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