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Graphic analysis of the effective reflectivity of antireflection-coated films on diode facets

机译:二极管面上抗反射膜的有效反射率的图形分析

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The wavelength dependence of the reflectivity of AR-coated facets and carrier density in relation to peak wavelength of the gain profile have been taken into consideration to study a one,facet AR-coated semiconductor diode laser. A graphic analysis method is developed to study cases in which analytical expressions of the reflectivity curves cannot be extracted. Results show that the upper bound of the carrier density that can be established inside the diode is generally (sometimes to a considerable degree) smaller than that determined by the claimed minimum reflectivity if the spectral width of the reflectivity curve cannot be regarded as infinite. This implies that the effective reflectivity of the AR-coated facet is generally larger than the claimed minimum reflectivity. To increase the effectiveness of AR film, it is essential to maintain tight control of the wavelength at which the reflectivity curve is minimum. # 1998 Optical Society of America OCIS codes: 140.0140, 140.3460, 140.2020.
机译:为了研究单面镀AR的半导体二极管激光器,已经考虑了镀有AR的小面的反射率与载流子密度的波长相关性与增益分布的峰值波长的关系。开发了一种图形分析方法来研究无法提取反射率曲线的分析表达式的情况。结果表明,如果不能将反射率曲线的光谱宽度视为无限,则可以在二极管内部建立的载流子密度的上限通常(有时在相当大的程度上)小于要求的最小反射率所确定的上限。这意味着涂有增透膜的刻面的有效反射率通常大于要求的最小反射率。为了提高增透膜的有效性,必须严格控制反射率曲线最小的波长。 #1998美国光学学会OCIS编码:140.0140、140.3460、140.2020。

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