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Laser sources in direct-view-scanning, tandem-scanning, or Nipkow-disk-scanning confocal microscopy

机译:直视扫描,串联扫描或Nipkow磁盘扫描共聚焦显微镜中的激光源

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Laser sources offer a potentially low-cost means of improving the light throughput in tandem-scanning confocal microscopy because of their high beam directionality. We measure and compare the optical sectioning characteristics of the tandem-scanning microscope (TSM) employing (i) the traditional choice of incoherent light from a Xe are lamp and (ii) a cited alternative-coherent light from a He-Ne laser source. In general the laser source is found to result in axial responses with pronounced sidelobes, the sizes and locations of which are extremely sensitive to the alignment of the pinhole array. The implications of these results for practical TSM systems are discussed. (C) 1998 Optical Society of America. [References: 17]
机译:激光源由于其高的光束方向性,提供了一种潜在的低成本方式来提高串联扫描共聚焦显微镜的光通量。我们使用以下两种方法测量和比较串联扫描显微镜(TSM)的光学切片特性:(i)氙的非相干光的传统选择是灯,(ii)氦氖激光源的替代性相干光。通常,发现激光源会产生带有明显旁瓣的轴向响应,旁瓣的大小和位置对针孔阵列的排列极为敏感。讨论了这些结果对实际TSM系统的影响。 (C)1998年美国眼镜学会。 [参考:17]

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