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Compact stand-alone near-field optical microscope combined with force detection

机译:紧凑型独立近场光学显微镜,结合力检测

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We present a compact stand-alone near-field optical microscope combined with force detection in which manufactured atomic force microscope (AFM) microcantilevers are used for both optical and force detection. Because of the stand-alone design, the combination allows a great variety of operation modes, including the scanning tunneling optical microscope (STOM), and possibly the reflection scanning nearfield optical microscope modes. The first images obtained in the AFM and the STOM mode are presented. A polarization study is carried out to confirm the optical nature of the detected signal and to discuss possible artifacts. (C) 1998 Optical Society of America. [References: 20]
机译:我们提出了一种紧凑的独立式近场光学显微镜,结合了力检测功能,其中制造的原子力显微镜(AFM)微型悬臂用于光学和力检测。由于采用独立设计,因此该组合可实现多种操作模式,包括扫描隧道光学显微镜(STOM)以及反射扫描近场光学显微镜模式。呈现了在AFM和STOM模式下获得的第一张图像。进行了极化研究以确认所检测信号的光学性质并讨论可能的伪像。 (C)1998年美国眼镜学会。 [参考:20]

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